General Electric Company

Bruce Courtney Amm

Radislav Alexandrovich Potyrailo

Yogen Vishwas Utturkar

Ernst Wolfgang Stautner

Richard Jeanluc St Pierre

Bu-Xin Xu

Alberto Santamaria-Pang

Patrick Joseph Howard

Charles Franklin Wolfe, Jr

Jinhua Huang

Jennifer Lynn Jackson

Bijan Dorri

Yousef Ahmed Al-Kofahi

Aghogho Atemu Obi

Michael J MacDonald

Roy A Mangano

Aritra Chowdhury

Shourya Sarcar

Eric Seth Moderbacher

Peter Arjan Wassenaar

John A Urbhan

David G Reeves

A multi-gas sensing system includes a sensing circuit comprising one or more sensing elements. Each sensing element includes a sensing material configured to detect at least one gas analyte. A management circuit is configured to excite the sensing elements with an alternating current at at least one predetermined frequency. The management circuit measures one or more electrical responses of the sensing elements responsive to exciting the sensing elements with the alternating current. The management circuit determines one or more characteristics of the sensing circuit. One or more processors receive the electrical responses of the sensing elements and the characteristics of the sensing circuit. The one or more processors determine a concentration of the at least one gas analyte based on the electrical responses of the sensing elements and the characteristics of the sensing circuit.

Multi-gas sensing system and method

A sensor system includes a sensing element that includes a sensing material and electrodes configured to apply a first electrical stimuli to the sensing material at an electrical excitation frequency, a modifier assembly including one or more circuits configured to change an electrical impedance of the sensing element, and one or more processors configured to control the modifier assembly. Responsive to exposure of gas to the sensing element, the one or more processors change a linearity of a first electrical signal received from the sensing element by changing the electrical impedance of the sensing element and applying a second electrical stimuli to the sensing material at the electrical excitation frequency.

Sensing system and method

An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.

Systems and methods for automatic defect recognition

A sensor system includes a first sensor to detect environmental conditions of an environment in operational contact with a subject, a second sensor to detect physiological parameters of the subject in operational contact with an asset, and a control unit comprising one or more processors communicatively coupled with the first sensor and the second sensor. The processors receive a first signal from the first sensor indicative of the environmental conditions, and receive a second signal from the second sensor indicative of the physiological parameters of the subject, and determine a relation between the environmental conditions and the physiological parameters based on the first signal and the second signal. The processors determine a responsive action of the asset based on the first signal indicative of the environmental conditions of the environment or the second signal indicative of the physiological parameters of the subject in operational contact with the asset.

A cooling system for reducing the thermal energy transfer from the heated spots of an RF coil assembly to a patient bore of an MRI system is disclosed. The MRI system includes a plurality of gradient coils positioned about a bore of a magnet, an RF shield formed about an RF space, and an RF coil assembly positioned within the RF space and about the patient bore. The cooling system is positioned within the RF space and includes a plurality of cooling modules configured to reduce an operating temperature of the MRI system. Each of the plurality of cooling modules further includes a thermoelectric cooler thermally coupled to the RF coil and a heat sink thermally coupled to the thermoelectric cooler opposite from the RF coil. The thermoelectric cooler is configured to extract heat from the RF coil when a current is applied to the thermoelectric cooler.

System and method for thermo-electric cooling of RF coils in an MR imaging system

The present invention is directed to a method of shimming a magnet assembly of an MR imaging system such that a desired B field strength may be created with minimal inhomogeneities therethrough. With this method, sufficient shimming of the magnet assembly may be achieved without requiring mechanical variations to the magnet assembly after the magnet assembly has been assembled. The invention analyzes variations from the desired B field and inhomogeneities at a number of target points along the magnet assembly or B field. A comparison is then made at each point to determine a shimming or weighting factor such that the desired overall B field strength and targeted field homogeneity is achieved. Active and/or passive shim elements may then be incorporated into the magnet assembly at each target point to achieve the desired overall field strength and minimum overall field homogeneity.

Method of magnetic field controlled shimming

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Clifton Park, NY, United States of America

Bruce Courtney Amm