Micron Technology Incorporated

Maxtor Corporation

Seagate Technology Incorporated

Bruce A Liikanen

Larry Joseph Koudele

Michael Sheperek

Gerald L Cadloni

Steven Michael Kientz

Shane G Nowell

Steve Kientz

Kishore Kumar Muchherla

John L Seabury

Francis Chew

Andrew W Vogan

Mustafa Nazmi Kaynak

John Charles Purkett

John VanLaanen

Peter Sean Feeley

Vamsi Pavan Rayaprolu

Don Brunnett

Stephen P Van Aken

John W Vanlaanen

David L Miller

Violante Moschiano

Thomas O Melrose

Michael G Miller

Renato C Padilla

Gary F Besinga

Guy R Wagner

Robert B Eisenhuth

Eric D Mudama

Brian P Rigney

John P Mead

Hai Thanh Ho

James P Crowley

Stan Shepherd

Anita Marguerite Ekren

Dave McMurtrey

Toan Q Doan

Stuart A Bell

Todd Franks

David L Rewerts

Bill Ray

Julian Lewkowicz

Mike L Mallary

Moris Musa Dovek

Lin Guo

Charles R Watt

Yu Sun

Lance R Carlson

Chandra C Varanasi

Stanley H Shepherd

Curtis W Egan

James W Hargarten

Xin Yang

S Craig Smith

Jerry Moline

Larry J Koudele

Craig Smith

Allen P Hartman

Jenny Himle

John W Van Laanen

Tie Jun Yie

Larry Roohr

Terry Keefer

Steve Ward

Stephen P VanAken

Terry Schemmel

An example memory sub-system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is configured to initialize a block family associated with a memory device; initialize a timeout associated with the block family; initializing a low temperature and a high temperature using a reference temperature at the memory device; responsive to programming a block residing on the memory device, associate the block with the block family; and responsive to at least one of: detecting expiration of the timeout or determining that a difference between the high temperature and the low temperature is greater than or equal to a specified threshold temperature value, close the block family.

Block family-based error avoidance for memory devices

A system includes a memory device and a processing device to initialize a block family associated with the memory device and a timer at initialization of the block family. The processing device further stores, in non-volatile memory of the memory device, a value of the timer before powering down the system while the block family is still open. The processing device further detects a power on of the system and measures a data state metric associated with one or more memory cell of a page of the memory device that is associated with the block family. The processing device further compares a level of the data state metric to a temporal voltage shift function to estimate a time after program value of the page and increments the value of the timer, restored from the non-volatile memory, based on the time after program value.

Open block family duration limited by time and temperature

An apparatus includes circuitry configured to generate multiple results, each result using a different read voltage, in response to one or each received data access command. The multiple read results may be used to dynamically calibrate a read voltage assigned to generate a read result in response to a read command.

Memory sub-system with dynamic calibration using component-based function(s)

A dynamic temperature compensation trim for use in temperature compensating a memory operation on a memory call of a memory component. The dynamic temperature compensation trim is based on a temperature of the memory component and based on in-service data for the memory operation on the memory cell. A register for the memory operation is modified based on the dynamic temperature compensation trim.

Dynamic temperature compensation in a memory component

A processing device determines a measured bit error count (BEC) value corresponding to a read sample offset operation executed on a first programming voltage distribution of memory cells of a plurality of programming voltage distributions of a memory sub-system. The measured BEC value of the portion of the programming voltage distribution is compared to a threshold BEC value to generate a comparison result. In view of the comparison result, an adjusted program start voltage level is determined by adjusting a default program voltage level of a programming process. The programming process including a series of programming pulses is executed, where the adjusted program start voltage level is set as a starting voltage level of a first programming pulse of the series of programming pulses.

Adjustment of a starting voltage corresponding to a program operation in a memory sub-system

A processing device determines difference error counts that are indicative of relative widths of valleys. Each of the valleys is located between a respective pair of programming distributions of memory cells of the memory device. A program targeting operation is performed on a memory cell of the memory device to calibrate one or more program verify (PV) targets associated with the programming distributions. To perform the program targeting operation, a rule from a set of rules is selected based on the difference error counts. The set of rules corresponds to an adjusting of a PV target of a last programming distribution. One or more program verify (PV) targets associated with the programming distributions are adjusted based on the selected rule.

Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distribution

A system includes a memory array; and a processing device coupled to the memory array. The processing device may be configured to iteratively adjust an active processing level, wherein, for each iteration, the processing device is configured to: determine a first set of read results corresponding to the active processing level, determine a second set of read results based on an offset processing level different than the active processing level, and incrementally adjust the active processing level based on a comparison of the first and the second read results.

Memory device with dynamic processing level calibration

The present disclosure is directed to logic based read sample offset operations in a memory sub-system. A processing device performs a first read, a second read, and a third read of data from a memory devices using a first center value corresponding to a first read level threshold, a negative offset value, and a positive offset value, respectively. The processing device performs a XOR operation on results from the first and second reads to obtain a first value and a XOR operation on results from the second and third reads to obtain a second value. The processing device performs a first count operation on the first value to determine a first difference bit count and a second count operation on the second value to determine a second difference bit count. The processing device can store or output the first difference bit count and the second difference bit count.

Logic based read sample offset in a memory sub-system

Disclosed is a system that comprises a memory device and a processing device, operatively coupled with the memory device, to perform operations that include, responsive to detecting a triggering event, selecting a family of memory blocks of the memory device, the selected family being associated with a set of bins, each bin associated with a plurality of read voltage offsets to be applied to base read voltages during read operations. The operations performed by the processing device further include calibration operations to determine data state metric values characterizing application of read voltage offsets of various bins. The operations performed by the processing device further include identifying, based on the determined data state metrics, a target bin and associating the selected family with the target bin.

Tracking and refreshing state metrics in memory sub-systems

A memory system includes a memory array including a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: determine a target profile including distribution targets, wherein each of the distribution targets represent a program-verify target corresponding to a logic value for the memory cells, determine a feedback measure based on implementing a processing level for processing data, and dynamically adjust the program-verify target according to the feedback measure.

Memory device with dynamic program-verify voltage calibration

Described herein are embodiments related to first-pass continuous read level calibration (cRLC) operations on memory cells of memory systems. A processing device determines that a first programming pass of a programming operation has been performed on a memory cell of a memory component. The processing device then adjusts a read level threshold of the memory cell to be centered between a first programming distribution and a second programming distribution before the second programming pass of the programming operation is performed on the memory cell.

First-pass continuous read level calibration

A program effective time (PET) for programming at least a portion of a plurality of memory cells based on one or more program step characteristics is determined. The determined PET and a target PET is compared. In response to the determined PET being different than the target PET, the one or more program step characteristics is adjusted to adjust the determined PET to the target PET.

Adjusting program effective time using program step characteristics

Disclosed is a system including a memory device having a plurality of physical cells and a processing device, operatively coupled with the memory device. The processing device maintains association of block families with a first (second, etc.) bin of a plurality of bins, each of the plurality of bins associated with one or more read voltage offsets. The read voltage offsets are used to compensate for a temporal read voltage shift caused by a charge loss by memory cells of the block families. Responsive to an occurrence of a power event, the processing device performs diagnostics of one or more blocks of various block families and determines whether to maintain association of the block families with current bins of the respective block families or to associate the block families with different bins.

Determination of state metrics of memory sub-systems following power events

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Berthoud, CO, United States of America

Bruce A Liikanen