Analog Devices,inc.

Analog Devices Global Unlimited Company

Bruce A Hecht

Robert A Duris

Alan J O'Donnell

Padraig Fitzgerald

Michael C W Coln

Ying Zhao

Mark Schirmer

Douglas W Babcock

Michael James Twohig

Stephan Goldstein

James Thomas Sheeran

Paul W Stevens

Olly J Kierse

Warren Hambly

Optically isolated micromachined (MEMS) switches and related methods are described. The optically isolated MEMS switches described herein may be used to provide isolation between electronic devices. For example, the optically isolated MEMS switches of the types described herein can enable the use of separate grounds between the receiving electronic device and the control circuitry. Isolation of high-voltage signals and high-voltage power supplies can be achieved by using an optical isolator and a MEMS switch, where the optical isolator controls the state of the MEMS switch. In some embodiments, utilizing optical isolators to provide high voltages, the need for electric high-voltage sources such as high-voltage power supplies and charge pumps may be removed, thus removing the cause of potential damage to the receiving electronic device. In one example, the optical isolator and the MEMS switch may be co-packaged on the same substrate.

System comprising a package having optically isolated micromachined (MEMS) switches with a conduit to route optical signal to an optical receiver and related methods

Optically isolated micromachined (MEMS) switches and related methods comprising a light transmitting adhesive layer between an optical receiver and a light source

A passive matching network is connected to an input/output line for an automatic test equipment drive channel to compensate for capacitances associated with a receiver circuit connected to the line, and also an optional current-mode driver circuit. The matching circuit preferably comprises a T-coil circuit that can include a bridging capacitor; separate T-coil circuits can be provided to separately compensate for receiver circuit and current-mode driver circuit capacitances. The driver and receiver circuits can be implemented on a common layer of an integrated circuit, with the T-coil windings implemented in a separate layer of the same integrated circuit that is spaced from the common layer by at least one dielectric layer.

T-coil apparatus and method for compensating capacitance

Automatic test equipment pin channel with T-coil compensation

Driver circuits and methods for operating driver circuits in automatic test equipment are provided. The driver circuit includes an output circuit operable in a dynamic mode and in a termination mode, and a mode control circuit for supplying a first current to the output circuit in the dynamic mode and for supplying a second current to the output circuit in the termination mode in response to a mode select signal. The mode control circuit may include a current multiplier and a switching circuit for switching a control current supplied to the current multiplier. In one example, the slew current supplied to the output circuit is controlled in response to the mode select signal.

Driver circuit with low power termination mode

An apparatus for conditioning an output waveform delivered from a testing device produces an output voltage that is the sum of a control voltage and an input voltage. To that end, the apparatus includes an input for receiving the input voltage, and an output capable of producing the output voltage. The output is coupled with the testing device. The apparatus further includes a voltage element coupled between the input and the output, and a switching element to alternatively charge and discharge the voltage element. The switching element controls the voltage element to change the control voltage between a first voltage and a second voltage. Consequently, the output voltage is the sum of the control voltage and the input voltage.

Circuit for conditioning output waveform

A clamp for use with a circuit (having an output for delivering an output voltage) forms a voltage boundary for the output voltage based upon a clamp voltage. To that end, the clamp includes a clamp input for receiving the clamp voltage, a clamp transistor in communication with the clamp input, and a control transistor in communication with the output. The clamp also includes a driving source for driving at least one of the clamp and control transistors based upon the voltage at the clamp input and the voltage at the output. The output is clamped at a voltage within the voltage boundary of the clamp voltage after the clamp transistor begins being driven by the driving source.

Programmable clamp for output circuit

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Brookline, MA, United States of America

Bruce A Hecht