Growing community of inventors

Milwaukee, WI, United States of America

Brian William Thomsen

Average Co-Inventor Count = 2.83

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 39

Brian William ThomsenPaul Edgar Licato (2 patents)Brian William ThomsenRahul Bhotika (2 patents)Brian William ThomsenXiaoye Wu (1 patent)Brian William ThomsenDarin Robert Okerlund (1 patent)Brian William ThomsenBradley Jay Gabrielse (1 patent)Brian William ThomsenRoy A Nilsen (1 patent)Brian William ThomsenPaulo Ricardo Mendonca (1 patent)Brian William ThomsenGrant Morey Stevens (1 patent)Brian William ThomsenJohn Lawrence Seamans (1 patent)Brian William ThomsenSardar Gautham (1 patent)Brian William ThomsenPaulo Ricardo Dos Santos Mendonça (1 patent)Brian William ThomsenBrian William Thomsen (6 patents)Paul Edgar LicatoPaul Edgar Licato (28 patents)Rahul BhotikaRahul Bhotika (17 patents)Xiaoye WuXiaoye Wu (55 patents)Darin Robert OkerlundDarin Robert Okerlund (47 patents)Bradley Jay GabrielseBradley Jay Gabrielse (20 patents)Roy A NilsenRoy A Nilsen (13 patents)Paulo Ricardo MendoncaPaulo Ricardo Mendonca (12 patents)Grant Morey StevensGrant Morey Stevens (10 patents)John Lawrence SeamansJohn Lawrence Seamans (5 patents)Sardar GauthamSardar Gautham (3 patents)Paulo Ricardo Dos Santos MendonçaPaulo Ricardo Dos Santos Mendonça (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. General Electric Company (6 from 51,920 patents)


6 patents:

1. 9036879 - Multi-material decomposition using dual energy computed tomography

2. 9008274 - Systems and methods for selecting image display parameters

3. 8311181 - Apparatus and method of visualizing multi-energy imaging data

4. 8260023 - Forward projection for the generation of computed tomography images at arbitrary spectra

5. 8115784 - Systems and methods for displaying multi-energy data

6. 7983382 - System and method for material segmentation utilizing computed tomography scans

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