Motorola Corporation

Brian W Lacy

Mario Frank DeRango

Daniel R Schroeder

Loren Francis Root

Jeffrey Alois Frei

Leslie D Mutz

Mark D Chapman

Kenneth P Weiss

Jerry S Flondro

A non-polarized laser trim chip stub in accordance with the invention includes a trimmable top conductor ( ) capable of being trimmed to alter the electrical properties of the chip stub, a bottom conductor ( ) having at least a first conductive portion ( ) and a second conductive portion ( ), a dielectric ( ) separating said top conductor from said bottom conductor, and conductive passages ( ) electrically connecting the top conductor or a portion thereof to the bottom conductor or a portion thereof. In alternate embodiments, the non-polarized laser trim chip stub's top conductor ( ) is separated into a trimmable stub portion ( ) and an end portion ( ), and the bottom conductor ( ) may be separated into three conductive portions ( and ) to allow for the middle portion ( ) to be used as a heat sink to aid in the dissipation of heat generated during high power applications.

Trimmable chip stub

The present invention includes an apparatus and a method for transceiver self-diagnostic testing in a communication system. A feedback unit (228, 326) is utilized that allows performance of a loopback test independent of a transmit frequency to receive frequency difference without undue proliferation of circuitry.

Transceiver self-diagnostic testing apparatus and method

Growing community of inventors

Marengo, IL, United States of America

Brian W Lacy