Xandex, Inc.

Brian P Phillips

James C Anderson

Charles Honek

A semiconductor wafer probe test interface system (2) and method of operating the system. The wafer probe system includes a plurality of cassettes (302) adapted to hold wafer probe test cards (304). The cassettes are loaded into position for testing of semiconductor wafers with a transport assembly system (6). A memory device (316) on the cassette is used to store data regarding usage of the card such as number of wafer touchdowns. A smart controller (220) has the capability to 'talk' to the prober and tester.

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Glen Ellen, CA, United States of America

Brian P Phillips