Hewlett-packard Company

Agilent Technologies, Inc.

Brian L Richardson

Jimmie Doyle Felps

Gerald R Kinsley

An electrical probe is provided for use with an electrical instrument, such as an oscilloscope. The probe includes a probe body, a sensing element affixed to the probe body for sensing an electrical parameter and a storage device containing probe information that uniquely identifies the probe. The probe information is electronically transferred from the storage device to the electrical instrument when the probe is connected to the electrical instrument. The electrical instrument stores calibration information that is associated with the probe. The electrical instrument uses the probe information received from the storage device in the probe to access the associated calibration information. The accessed calibration information is used to calibrate measurements made with the probe.

Calibrating combinations of probes and channels in an oscilloscope

An interface having nine connections between a probe and test and measurement equipment includes a fixed voltage source located in the test and measurement equipment, which delivers through a first connection a positive fixed voltage, and through a second connection a negative fixed voltage. A voltage-programming resistor located in the probe produces a signal that is delivered from the probe through one of the connections to the equipment to control a programmed voltage source. The programmed voltage is delivered as a positive programmed voltage through one pin and as a negative programmed voltage through a second connection. A probe identification resistor is located in the probe. An ohmmeter in the equipment measures the resistance of the probe identification resistor through one of the connections. This identity is delivered into the equipment so that the equipment, by accessing an internal look-up table, can obtain the probe's characteristics to configure the equipment for the circuit requirements of the probe. A two-way communication path between the probe and the test and measurement equipment is provided through two of the connections. An offset current is provided in the equipment and is delivered through one connection to the probe.

Growing community of inventors

Port Richey, FL, United States of America

Brian L Richardson