Apple Inc.

Brian J Nalle

Jeffrey B Reed

Michael A Dukes

Techniques and structures relating to consistency management for fabrication data are disclosed. A plurality of data sources may contain different values for a variety of design parameters usable by electronic circuit design tools to physically lay out at least a portion of an integrated circuit (such as minimum spacing rules, etc.). By seeking to detect different parameter values and/or parameter values that fail to meet a confidence threshold, potential errors may be uncovered at an earlier stage of the design process. Error detection may occur in response to a request to a database, or as part of a consistency check. Different file formats for different design tools may be imported into a central database to facilitate system operation, and an application programming interface may be used to acquire or calculate data values and perform checks in some embodiments.

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Austin, TX, United States of America

Brian J Nalle