X Development LLC

Brian Howell

Allen Richard Zhao

Antonio Raymond Papania-Davis

Charles Stephen Spirakis

Ray Anthony Nagatani, Jr

Methods, systems, and apparatus, including computer programs encoded on computer storage media, for characterization of aggregate particles. A method includes obtaining, from a set of low fidelity sensors, first sensor data of a first portion of particles; obtaining, from a set of high fidelity sensors, second sensor data of the first portion of particles, the second sensor data comprising a higher fidelity representation of characteristics of the first portion of particles than the first sensor data; training a characterization model using the first sensor data and the second sensor data, the training comprising: providing, as training data to the characterization model, the second sensor data; and processing the second sensor data with the characterization model to correlate the first sensor data with the second sensor data. The first sensor data can indicate shape characteristics of each particle; and the second sensor data indicates a surface area of each particle.

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Brian Howell