Massachusetts Institute of Technology

Harvard College

Brian G Saar

Thomas H Jeys

Alexander Stolyarov

William D Herzog

Ryan Sullenberger

Shawn Michael Redmond

David Crompton

Richard Charles Westhoff

Christian W Freudiger

Tom Reynolds

James K Kuchar

Sunney Xiaoliang Xie

Julia A Fang

Erin Tomlinson

Alexander M Stolyarov

Laser light source geolocation. The system includes two spaced-apart ground based sensors for receiving light from a laser source that has been off-axis scattered by air molecules and particulates to form scattered light imagery. A processor operates on the imagery from the two sensors to geolocate the laser light source on the ground.

Ground-based system for geolocation of perpetrators of aircraft laser strikes

A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.

Material property determination using photothermal speckle detection

A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.

Devices and methods for sensing targets using photothermal speckle detection

A microscopy or micro-spectroscopy system is disclosed that includes a first light source, a second light source, a modulator, an optical assembly and a processor. The first light source is for providing a first illumination field at a first optical frequency &#x3c9;and the second light source is for providing a second illumination field at a second optical frequency &#x3c9;. The modulator is for modulating a property of the second illumination field at a modulation frequency f of at least 100 kHz to provide a modulated second illumination field. The optical assembly includes focusing optics and an optical detector system. The focusing optics is for directing and focusing the first illumination field and the modulated second illumination field through an objective lens toward the common focal volume along an excitation path.

Systems and methods providing efficient detection of back-scattered illumination in modulation transfer microscopy or micro-spectroscopy

Growing community of inventors

Cambridge, MA, United States of America

Brian G Saar