Agilent Technologies, Inc.

Keysight Technologies, Inc.

Brian D Setterberg

August Jon Hidalgo

George Stennis Moore

Sourja Ray

Michael Manlove

A system and method for detecting and correcting large errors during ADC operation. The system includes an ADC; an AAF at the input of the ADC, having bandwidth less than information bandwidth of the ADC; and a large-error detection and correction processing unit at the output of the ADC. The large-error detection and correction circuit includes an interpolation filter to determine values of predicted digital samples corresponding to actual digital samples in a sequence of digital samples from the ADC based on information from neighboring digital samples. A signal-delay circuit in parallel with the interpolation filter delays the actual digital samples by an amount of a lag from the interpolation filter. An adder determines differences between the predicted and actual digital samples, a matched filter detects a pattern of the differences, and a large-error detection processing unit determines whether a large error occurs based on the pattern of the differences.

Large-error detection and correction of digital sample sequence from analog-to-digital converter

A detection signal generated in response to incident ions accelerated at temporally-irregular intervals having an average repetition rate greater than a reference repetition rate represents detection events each having an event time and an intensity. For each detection event, respective allowed TOFs between the event time and the transient times are calculated. Using respective initial probabilities, initial apportionments of the intensity of each detection event among the allowed TOFs linked thereto are determined. For each allowed TOF, the intensity apportionments thereto are accumulated to generate an intensity accumulation linked thereto. For each detection event, respective revised probabilities are iteratively determined using the intensity accumulations linked to the allowed TOFs linked thereto, and the respective intensity is iteratively reapportioned among the allowed TOFs linked thereto using the revised probabilities to transform the detection signal to a time-of-flight spectrum.

Dithered multi-pulsing time-of-flight mass spectrometer

A circuit design incorporates charge compensation devices within a Track-and-Hold (T/H) circuit to control channel charge generated by a tracking switch. Calibrating a T/H circuit requires selecting charge compensation devices from an array of similar devices to function within the T/H circuit to absorb charge ejected from the tracking switch. The charge compensation devices can also be pseudorandomly selected to operate within the T/H circuit. Charge compensation devices are used to enhance the performance of bottom-plate sampling systems as well as bootstrapped T/H circuits.

Track-and-hold circuit with adjustable charge compensation

Embodiments of the current-mode track and hold circuit comprise a cascode input stage, a dynamic biasing stage, a cascode output stage, and a switch operable to interconnect the input stage and the output stage. The input stage is connected to receive an input current. The dynamic biasing stage is connected to receive a scaled version of the input current as a dynamic biasing current and dynamically biases the input stage in response to the dynamic biasing current. Dynamically biasing the track-and-hold circuit in response to a dynamic biasing current that is a scaled version of the input current significantly increases the maximum peak-to-peak voltage swing allowed at the input of the track-and-hold circuit and enables a corresponding increase in signal-to-noise ratio. These benefits are obtained at the expense of only a small increase in power consumption.

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Menlo Park, CA, United States of America

Brian D Setterberg