Texas Instruments Corporation

Brian D Borchers

Clive D Bittlestone

Bryan David Sheffield

Stephen Wayne Spriggs

Steven P Korson

Doug Counce

A method for evaluating an output of a sequential circuitby storing a series of output pulses from the sequential circuitand determining whether the output pulsestoggled as desired. Also a circuitfor evaluating an outputof a sequential circuitthat determines if the output pulsestoggled as desired.

Error bit method and circuitry for oscillation-based characterization

An embodiment of the invention is a method for measuring access time where the frequency of a ring oscillator is measured with and without a device under testin the ring. Those two frequencies are compared to calculate the access time of the device under test. Another embodiment of the invention is circuitrythat measures the frequency of a ring oscillator with and without a device under test. Again the two frequencies are compared to calculate the access time of the device under test

Oscillation based access time measurement

A method and circuit for verifying the burst-mode operation and the frequency characterization of a self-timed sequential circuit in burst mode by detecting and measuring an output of the self-timed sequential circuit

Characterization of self-timed sequential circuits

An embodiment of the invention is circuitry that contains a programmable delay and a pulse generator that send clock signals of a certain frequency to a device under test . The programmable delay increases the frequency of the clock signal to the device under test until the device under test fails. The cycle time measurement of the device under test is the period of maximum frequency at which the device under test operates properly.

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Wylie, TX, United States of America

Brian D Borchers