Adv Antest Corporation

Brian Buras

Henry Arnold

Pierre Gauthier

James Stephen Ledford

Ira Leventhal

Keith Schaub

Alan Hart

Constantinos Xanthopoulos

Kenneth Butler

Embodiments of the present invention provide systems and methods for multidimensional parts average testing for testing devices and analyzing testing results to detect outliers according to embodiments of the present invention. The testing can include calculating multivariate (e.g., bivariate) statistics using delta measurements of like devices, a ratio of measurements, or principal component analysis that identifies eigenvectors and eigenvalues to define meta parameters, for example. Raw test result data can be converted to residual space and robust regression can be performed to prevent outlier results from influencing regression, thereby reducing overkill advantageously.

Systems and methods for multidimensional dynamic part average testing

A method of performing a test using automated test equipment (ATE) is disclosed. The method comprises configuring a proxy application programming interface (API) services module, wherein the proxy API services module provides an interface between a test framework and a test software environment, wherein the test framework communicates with the test software environment though the proxy API services module, wherein the test software environment is communicatively coupled with test hardware, and wherein the proxy API services module is configured to isolate the test framework from dependencies associated with the test software environment. The method further comprises communicating commands synchronously between the test framework and the test software environment, wherein the test framework comprises a plurality of components, and wherein the plurality of components is operable to receive commands from the test software environment and further operable to transmit commands to the test software environment through the proxy API services module.

Method and apparatus for an efficient framework for testcell development

A method of testing a device. The method comprises determining a computational window. The computational window is a time period of device testing activity below an activity threshold. The at least one computational window occurs during the device testing activity. The method further comprises creating and executing a decision tree during the computational window. The decision tree comprises a scheduled test analysis of test results and a selection of test control actions scheduled to execute in response to the test analysis.

Creation and scheduling of a decision and execution tree of a test cell controller

An apparatus for testing a device. The apparatus comprises a test control module and a test analysis module. The test control module is operable to generate and transmit first prober and handler (PH) requests to a supervisor module. The supervisor module is operable to transmit first PH commands to a prober and handler for execution thereof. The test analysis module is operable to generate and transmit second PH requests to the supervisor module. The supervisor module is further operable to transmit second PH commands to the prober and handler for execution thereof. The execution of the second PH commands are performed transparently to the test control module.

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Austin, TX, United States of America

Brian Buras