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Atomic Energy of Canada Limited

Brian A Lepine

Dag Horn

Jia Lei

Joseph Renaud

Laurie Davey

Richard Lakhan

A system and method for non-destructive analysis of a structure. A probe acquires a transient time based reference signal and at least one test signal. The reference signal and test signals are transformed to the frequency domain. The frequency domain test signal can be normalized using the frequency domain reference signal. Parameters of interest are evaluated at each test location by iteratively determining estimated parameter values, generating an estimated frequency domain test signal using the estimated parameter values and determining the convergence between the estimated frequency domain test signal and the normalized frequency domain test signal. The parameters values are determined as the estimated parameter values resulting in a maximized convergence between the estimated signal and the normalized test signal. The parameter values can be used to visualize and model various features of the structure.

Method for non-destructive analysis of multiple structural parameters

The present invention provides a probe apparatus and an associated method for measuring a magnetite deposit thickness, which apparatus and method is independent of the porosity and magnetic permeability of the magnetite deposit. The probe apparatus of this invention is an axial scanning and inside surface-following probe that can accurately and reliably measure the inside diameter of a tube. The probe apparatus of the present invention optionally comprises two modules: the first module is the surface-following module and the second module is a conventional eddy current probe.

Apparatus and method for measuring deposits inside a tube

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Petawawa, Canada

Brian A Lepine