Intel Corporation

Brett Neal

Andrew McRonald

Neal Meyer

Ping Sun

Lee Genz

Gene Garrison

Some embodiments provide identification of a first polyline and a second polyline associated with a differential signal, determination of whether a distance between a segment of the first polyline and a segment of the second polyline is within a first tolerance, determination, if the distance is not within the first tolerance, of whether the distance is within a second tolerance, determination, if the distance is not within the first tolerance and is within the second tolerance, of whether the length of the segment of the first polyline is less than a first threshold, and to indicate that the first polyline and the second polyline are sufficiently spaced, if the distance is not within the first tolerance and is within the second tolerance, and if the length of the segment of the first polyline is less than the first threshold.

Checks for signal lines

Design checks for signal lines

A method and apparatus to adaptively validate a physical net routing topology of a substrate design to a target topology of the substrate design. A tree data structure is generated by mapping physical net routing topology objects to tree data structure objects the tree data structure representing the substrate design. The tree data structure is then compressed to form a compressed tree data structure. The compressed tree data structure is validated by comparing the target topology with the compressed tree data structure to determine if the target topology is electrically equivalent to the compressed tree data structure. One or more branches of the validated tree data structure is named, and the validated tree data structure is partitioned and saved.

Method and apparatus to adaptively validate a physical net routing topology of a substrate design

A system to evaluate a distance between polyline segments includes identification of a first polyline and a second polyline associated with a differential signal, determination of whether a distance between a segment of the first polyline and a segment of the second polyline is within a first tolerance, and, if the distance is not within the first tolerance, determining whether the distance is within a second tolerance. If the distance is not within the first tolerance and is within the second tolerance, it is determined whether the length of the segment of the first polyline is less than a first threshold. If the distance is not within the first tolerance and is within the second tolerance, and if the length of the segment of the first polyline is less than the first threshold, it is indicated that the first polyline and the second polyline are sufficiently spaced. If the distance is not within the second tolerance or if the length of the segment of the first polyline is greater than the first threshold, it is determined whether the segments are located near a device pin, and, if the segments are not located near a device pin, it is indicated that the first polyline and the second polyline are not sufficiently spaced.

Growing community of inventors

Gilbert, AZ, United States of America

Brett Neal