Particle Measuring Systems, Inc.

Brett Haley

Matt Michaelis

Brian A Knollenberg

Thomas A Bates

Dan Rodier

Mark A Lilly

Daniele Pandolfi

Jim Lumpkin

Matt Soappman

Scott MacLaughlin

Clayton Ellinwood

Benjamin Martinez

Joseph Thomas Cilke

Mark Lilly

A method for reducing false-positive particle detection events of an optical particle detection system includes: filtering raw particle count data to produce filtered particle count data. The filtering includes: temporarily storing the raw particle count data for a buffering time period; segmenting the raw particle count data into a series of elemental data intervals; examining each elemental data interval for a noise signature; identifying a noise signature in the segmented raw particle count data; in response to the identified noise signature, flagging one or more sequential elemental data intervals as corresponding to a noise event; and removing the one or more flagged elemental data intervals from the raw particle count data to produce the filtered particle count data, and/or generating replacement data and substituting the replacement data for the one or more flagged elemental data intervals to produce the filtered particle count data.

Systems and methods for reducing false positive particle detection events in a particle detector

Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up. Embodiments of the disclosure facilitate various efficiency improvements for manufacturing operations reliant on particle sampling devices.

User access-restrictive systems and methods for operating particle sampling devices

Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.

Calibration verification for optical particle analyzers

Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.

The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.

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Boulder, CO, United States of America

Brett Haley