Intel Corporation

Brett E Klehn

Johannes A Kalb

Derchang Kau

Abram M Detofsky

An optical spectral analyzer for measuring an optical multi-channel signal by separating the multi-channel signal and measuring a plurality of single-channel signals simultaneously. The spectral analyzer can include a demultiplexer configured to receive the multi-channel signal. The multi-channel signal can be a multi-channel wavelength range. The demultiplexer can separate the multi-channel signal into the plurality of single-channel signals including a first single-channel signal and a second single-channel signal. The spectral analyzer can include a plurality of optical paths. The plurality of optical paths can include a plurality of respective detectors for measuring an optical power of the respective single-channel signals. The detectors can convert the optical power of the respective single-channel signals to corresponding electrical signals. In some examples, the spectral analyzer includes a controller configured to obtain the plurality of respective electrical signals simultaneously to correspondingly detect the optical power of the multi-channel signal across the multi-channel wavelength range.

Increased processing efficiency for optical spectral analyzers

A phase change memory (PCM) device utilizes low energy pulses to write data to PCM storage elements (cells). Methods, devices and systems are described that use low energy reset pulses to reset cells that have been previously set using a method that keeps a portion of the PCM cells in an amorphous phase. The reset is reversible by utilizing a low energy set pulse.

Reversible low-energy data storage in phase change memory

Double-pulse write for phase change memory including: writing a phase change material from a high RESET state to a weakened RESET state with a first step, writing the phase change material from the weakened RESET state to a SET state with a second step, the second step having a lower current than the first step, verifying a parameter of the phase change material wherein if the parameter is higher than a target for a SET state, then repeating the writing with the first step, the writing with the second step, and the verifying until the parameter is lower than the target wherein a current for the first step is decreased by a decrement with each iteration without becoming lower than a current for the second step.

Growing community of inventors

Santa Clara, CA, United States of America

Brett E Klehn