Intel Corporation

Brett D Grossman

Abram M Detofsky

Pooya Tadayon

Jin Pan

Roy Swart

Ronald K Minemier

Warren Stuart Crippen

Chukwunenye S Nnebe

John Michael Peterson

In accordance with one aspect of the present description, an interface between an integrated circuit device and a test controller for testing the integrated circuit device includes a plurality of boards coupled together. In one embodiment, the test interface includes a plurality of interchangeable auxiliary boards, each having test circuitry, which may be coupled to a primary board and reused as appropriate to test various integrated circuits. Other aspects are described.

Integrated circuit testing architecture

Testing methods and systems are described. One method for testing an electronic device includes providing a probe in electrical contact with a device. The method also includes positioning an interface of the probe and the device in a liquid medium. The method also includes transmitting a current from the probe through the interface while the interface is in the liquid medium. Other embodiments are described and claimed.

Increasing current carrying capability through direct liquid cooling of test contacts

A mechanism is described for facilitating optical testing of a device under test (DUT) using a testing mechanism having multiple testing paths according to one embodiment. A method of embodiments of the invention may include facilitating, via a loopback path, optical testing of the DUT in a loopback configuration. The loopback configuration may allow for looping between one or more transmitters and one or more receivers of the DUT. The method may further include facilitating, via a spectral path, spectral measurements relating to the DUT.

Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths

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Forest Grove, OR, United States of America

Brett D Grossman