Nan Ya Technology Corporation

International Business Machines Corporation

Green Mountain Semiconductor Inc.

Bret Roberts Dale

Darin James Daudelin

Ryan Andrew Jurasek

Dave Eugene Chapmen

Oliver Kiehl

Douglas Willard Stout

Sebastian Theodore Ventrone

Joseph Andrew Iadanza

Francis H Chan

William L Bucossi

Hongfei Wu

David T Kinney

Todd M Fisher

Techniques for manipulation of a recursive neural network using random access memory are disclosed. Neural network descriptor information and weight matrices are stored in a semiconductor random access memory device which includes neural network processing logic. The network descriptor information and weight matrices comprise a trained neural network functionality. An input matrix is obtained for processing on the memory device. The trained neural network functionality is executed on the input matrix, which includes processing data for a first layer from the neural network descriptor information to set up the processing logic; manipulating the input matrix using the processing logic and at least one of the weight matrices; caching results of the manipulating in a storage location of the memory device; and processing recursively the results that were cached through the processing logic. Additional data for additional layers is processed until the neural network functionality is complete.

Recursive neural network using random access memory

A decoupling capacitance (decap) calibration device includes a plurality of parallel decoupling capacitors configured to be electrically connected to a power supply at a point between the power supply and logic circuitry. The plurality of capacitors exhibit a plurality of different capacitance values and are configured to independently turn on or off according to a plurality of inputs. Decap calibration circuitry is configured to update the plurality of inputs in response to a determination signal. A voltage detector is configured to detect a voltage at an output of the plurality of capacitors and to compare the output voltage to a reference voltage. The decap calibration device is configured to generate the determination signal in response to the voltage comparison.

Decoupling capacitance calibration devices and methods for DRAM

A circuit test interface and a test method are disclosed. The circuit test interface may include a test voltage input pad, a test voltage output pad, and a plurality of input buffers. Each of the plurality of input buffers may have a first input terminal, a second input terminal, and an output terminal. The first input terminal of each respective input buffer may be coupled to one of a plurality of through-silicon vias (TSVs). The circuit test interface may further include a plurality of switch units. Each of the plurality of switch units may have a first terminal and a second terminal. The circuit test interface may further include a scan chain, coupled to both the output terminal of each of the plurality of input buffers and to the test voltage output pad.

Circuit test interface and test method thereof

A circuit testing interface and test method are disclosed. The circuit testing interface may include a test current transmitting pad, a test voltage measuring pad, and at least one driving circuit comprising an output terminal. The output terminal of the at least one driving circuit may be coupled to a through-silicon via (TSV). The circuit testing interface may further include at least one switch module, coupled to (1) the output terminal of the driving circuit, (2) the test current transmitting pad, and (3) the test voltage measuring pad.

Test method of driving apparatus and circuit testing interface thereof

A testing circuit for verifying the impedance of off-chip drivers includes: a plurality of off-chip drivers (OCD), each off-chip driver including a through-silicon via (TSV); an IREF test pad, for driving a current to the plurality of off-chip drivers; a plurality of pre-drivers, each respective pre-driver coupled to one of the plurality of off-chip drivers, wherein the plurality of pre-drivers are configured to turn on the off-chip drivers; a VREF test pad, for inputting a reference voltage to the testing circuit; a plurality of input buffers (IB) for outputting a plurality of comparison results, each of the plurality of input buffers configured to output the plurality of comparison results according to the reference voltage and the voltage at the TSV nodes; and a test pad, coupled to the plurality of IBs, for receiving the comparison results to determine whether the impedance of each OCD is within a desired range.

System and method for testing off-chip driver impedance

A method of detecting a minimum operational frequency includes: generating a signal that becomes an oscillating signal at a first predetermined frequency; and generating a logic signal to provide a level transition when a frequency of the oscillating signal reaches a second predetermined frequency corresponding to the minimum operational frequency. The logic signal is generated by: providing a transistor that is activated at the second predetermined frequency; providing a capacitor; storing charges in the capacitor when the oscillating signal is below the second predetermined frequency; discharging the capacitor when the transistor is activated by the oscillating signal; and outputting the logic signal when the capacitor discharges.

Method for detecting minimum operational frequency

A low-voltage current reference providing a current being substantially constant with temperature includes a low voltage bandgap, a start circuit coupled to the low voltage bandgap, and a current summer coupled to the low voltage bandgap and to the start circuit. The low voltage bandgap is for providing a constant voltage reference, and the start circuit is for starting the low voltage bandgap from a non-start mode and for providing a proportional to absolute temperature (PTAT) current reference. The current summer is for providing a constant current reference according to the constant voltage reference and the PTAT current reference.

Low-voltage current reference and method thereof

A power-on detection circuit for detecting a minimum operational frequency includes: an oscillating circuit, which includes: a ring oscillator, for generating a first oscillating signal; and a high pass filter for filtering the first oscillating signal to generate a second oscillating signal. The power-on detection circuit also includes a rectification device, coupled to the high pass filter, for generating a logic signal once the second oscillating signal reaches a certain frequency.

Power-on detection circuit for detecting minimum operational frequency

An apparatus for compensating slew rate of a driving circuit includes: a first circuit, for receiving an edge transition from the driving circuit and generating a first pulse proportional to an actual slope of the edge transition; a second circuit, for receiving an ideal edge transition of the driving circuit and generating a second pulse proportional to an ideal slope of the ideal edge transition; a comparison circuit, coupled to the first circuit and the second circuit, for comparing an extreme value of amplitude of the first pulse with an extreme value of amplitude of the second pulse to produce a comparison signal; and a control circuit, coupled to the comparison circuit, for increasing or decreasing the slew rate of the driving circuit according to the comparison signal.

Driving circuit slew rate compensation method

A dynamic voltage pump circuit includes a first stage voltage pump, a second stage voltage pump, a limiter, and a comparator. The first stage voltage pump generates an intermediate supply voltage according to an input supply voltage and a pump signal. The second stage voltage pump generates an output supply voltage according to the intermediate supply voltage, the pump signal, and an enable signal; the second stage voltage pump is enabled and disabled when the enable signal is asserted and de-asserted, respectively. The limiter controls the pump signal according to a comparison of the output supply voltage with a first reference voltage. The comparator compares the first reference voltage with a second reference voltage to generate the enable signal, and can assert the enable signal when the desired output supply voltage exceeds the maximum possible intermediate supply voltage generated by the first stage voltage pump.

Dynamic voltage pump circuit and method of dynamically generating an output supply voltage thereof

A system for generating an ideal rise or fall time includes: a first current source, for providing a first current; an adjustable capacitive component, coupled to the first current source, for generating an output signal according to a total capacitance controlled by a comparison signal; a signal conversion circuit, coupled to the adjustable capacitive component, for restoring charges stored in the adjustable capacitive component to a predetermined value when a voltage level of the output signal reaches a reference value to generate a clock-like signal; and a comparison circuit, coupled to the signal conversion circuit and the adjustable capacitive component, for comparing a period of the clock-like signal with a reference period of a reference clock signal and generating the comparison signal to adjust the total capacitance of the adjustable capacitive component when periods are not the same.

System and apparatus for generating ideal rise and fall time

The inventions herein are directed to an inventive bus keeper and logic circuit for use with an I/O circuit, for example, for use on the receiver side of the I/O buffer circuit. The inventive circuit connects one data line of an IC function to one line of a tri-state bus (one bit of data per bus line or wire). The bus keeper and logic control circuit is maintained in isolation from I/O functional driver and is responsive to a tri-state signal (TS), normally provided by the IC or SOC, or the I/O circuit during normal I/O receiver side operation. The inventive bus keeper and logic circuit selectively enables any of a tri-state state, a pull-up state, pull-down state and bus keep mode state at the driver output pad in the presence of the tri-state enable signal, and is disabled when the I/O bus drive buffer circuit is in drive mode.

Electronic circuit for maintaining and controlling data bus state

A driver including boost circuitry for reducing tri-state delay. Boost circuitry includes boost legs ( ) and ( ) having boost delay chains ( ) and ( ), respectively. Subcircuits ( ) and ( ) may include a series of inverters or other devices to delay a tri-state enable signal (EN ) or (EN BAR) for a predetermined amount of time substantially equivalent to the time it takes for a first signal (A ) to travel from input pin A to PAD. Transient current provides a boost by discharging or charging output nodes (G ) and (G ), respectively. Boost legs ( ) and ( ) remain on for the length of time it takes for enable signal (EN ) or (EN BAR) to travel through subcircuits ( ) and ( ). The boost increases the rate of transition of output nodes (G ) and (G ) thereby reducing the delay of tri-state signal (EN ).

Tri-state delay boost

The present invention provides a receiver device having multiple voltage supplies that allows the output stage of the receiver device to go to a safe state whenever its voltage is disconnected or powered-down, independent of any of its normal control circuits. Furthermore, the isolation of the multiple voltage supplies provides a low skew at the output of the receiver device.

Low skew, power sequence independent CMOS receiver device

A method and apparatus for implementing a dual voltage driver circuit having two predrive circuits for driving the supported voltages. The driver circuit automatically senses the operating voltage and selects the appropriate predrive circuitry while isolating the non-selected predrive circuitry from the sensed voltage.

Growing community of inventors

Jericho, VT, United States of America

Bret Roberts Dale