Rambus Inc.

Hefei Reliance Memory Limited

Sandisk 3d LLC

Cryptography Research, Inc.

Other

Micron Technology Incorporated

Sandisk Technologies Inc.

Brent Steven Haukness

Frederick Abbott Ware

Gary Bela Bronner

Thomas Vogelsang

Ian P Shaeffer

Zhichao Lu

Scott C Best

John Eric Linstadt

Deepak Chandra Sekar

Hongzhong Zheng

Tyler J Thorp

Wayne Frederick Ellis

Mark D Kellam

Lawrence Lai

Mark A Horowitz

Kevin S Donnelly

Mark G Johnson

Kenneth Lee Wright

Fariborz Assaderaghi

Carl William Werner

Bruce Lynn Bateman

Liji Gopalakrishnan

J James Tringali

Stephen Charles Bowyer

Suresh Rajan

Steven Cameron Woo

Bohuslav Rychlik

James Edward Harris

Jaeha Kim

Dongyun Lee

Trung Am Diep

Henry Hutton

Yoshihito Koya

Eric Linstadt

Mehmet Günhan Ertosun

Kit Fai Chan

A memory module includes one or more memory devices and a memory interface chip coupled to the one or more memory devices via one or more communication links. The memory module further includes a persistent memory storing one or more sets of training and calibration settings corresponding to communication over the one or more communication links, where the one or more sets of training and calibration settings are stored in the persistent memory before operation of the memory module and used to configure one or more components of the memory interface chip during the operation of the memory module.

Memory module with persistent calibration

Disclosed is a resistive random access memory (RRAM) circuit and related method to limit current, or ramp voltage, applied to a source line or bitline of an RRAM array. The RRAM array has one or more source lines and one or more bitlines. A control circuit sets an RRAM cell to a low resistance state in a set operation, and resets the RRAM cell to a high resistance state in a reset operation. A voltage applied to a bitline or source line is ramped during a first time interval, held to a maximum voltage value during a second interval, and ceased after the second time interval.

Method of RRAM write ramping voltage in intervals

A memory device is disclosed that includes a row of storage locations that form plural columns. The plural columns include data columns to store data and a tag column to store tag information associated with error locations in the data columns. Each data column is associated with an error correction location including an error code bit location. Logic retrieves and stores the tag information associated with the row in response to activation of the row. A bit error in an accessed data column is repaired by a spare bit location based on the tag information.

Memory device and repair method with column-based error code tracking

Disclosed is a resistive random access memory (RRAM). The RRAM includes a bottom electrode made of tungsten and a switching layer made of hafnium oxide disposed above the bottom electrode, wherein the switching layer includes a switchable filament. The RRAM further includes a resistive layer disposed above the switching layer and a bit line disposed above the resistive layer, wherein the resistive layer extends laterally to connect two or more memory cells along the bit line.

RRAM process integration scheme and cell structure with reduced masking operations

A memory module is disclosed. The memory module includes a substrate, and respective first, second and third memory devices. The first memory device is of a first type disposed on the substrate and has addressable storage locations. The second memory device is also of the first type, and includes storage cells dedicated to store failure address information associated with defective storage locations in the first memory device. The third memory device is of the first type and includes storage cells dedicated to substitute as storage locations for the defective storage locations.

Memory module with dedicated repair devices

The dynamic memory array of a DRAM device is operated using at least two voltages. The first voltage, which is used to power the sense amplifiers during sense (i.e., read) operations and most other column operations (e.g., precharge, activate, write), is the operating (i.e., switching) voltage of a majority of the digital logic circuitry of the DRAM device. The second voltage, which determines the voltage written to the capacitor of the DRAM cells (i.e., bitline voltage) is greater than the operating (i.e., switching) voltage of a majority of the digital logic circuitry of the DRAM device. The digital logic circuitry is operated using a supply voltage that is lower than the voltage written to the capacitors of the DRAM array. This allows lower voltage swing digital logic to be used for a majority of the logic on the DRAM device while writing a larger voltage to the DRAM cells.

Boosted writeback voltage

The present embodiments provide a system that supports self-refreshing operations in a memory device. During operation, the system transitions the memory device from an auto-refresh state, wherein a memory controller controls refreshing operations for the memory device, to a self-refresh state, wherein the memory device controls the refreshing operations. While the memory device is in the self-refresh state, the system sends progress information for the refreshing operations from the memory device to the memory controller. Next, upon returning from the self-refresh state to the auto-refresh state, the system uses the progress information received from the memory device to control the sequencing of subsequent operations by the memory controller.

Protocol for refresh between a memory controller and a memory device

A memory module includes at least two memory devices. Each of the memory devices perform verify operations after attempted writes to their respective memory cores. When a write is unsuccessful, each memory device stores information about the unsuccessful write in an internal write retry buffer. The write operations may have only been unsuccessful for one memory device and not any other memory devices on the memory module. When the memory module is instructed, both memory devices on the memory module can retry the unsuccessful memory write operations concurrently. Both devices can retry these write operations concurrently even though the unsuccessful memory write operations were to different addresses.

Unsuccessful write retry buffer

An integrated-circuit neural network includes chain of multiply-accumulate units co-located with a high-bandwidth storage array. Each multiply accumulate includes a digital input port, analog input port and multiply-adder circuitry. The digital input port receives a matrix of digital-weight values from the storage array and the analog input port receives a counterpart matrix of analog input signals, each analog input signal exhibiting a respective electronic current representative of input value. The multiply-adder circuitry generates a matrix of analog output signals by convolving the matrix of digital-weight values with the matrix of analog input signals including, for each analog output signal within the matrix of analog output signals, switchably enabling weighted current contributions to the analog output signal based on logic states of on respective bits of one or more of the digital-weight values.

Memory-integrated neural network

Memory controllers, devices, modules, systems and associated methods are disclosed. In one embodiment, a memory controller is disclosed. The memory controller includes write queue logic that has first storage to temporarily store signal components of a write operation. The signal components include an address and write data. A transfer interface issues the signal components of the write operation to a bank of a storage class memory (SCM) device and generates a time value. The time value represents a minimum time interval after which a subsequent write operation can be issued to the bank. The write queue logic includes an issue queue to store the address and the time value for a duration corresponding to the time value.

Deterministic operation of storage class memory

A memory component internally generates and stores the check bits of error detect and correct code (EDC). In a first mode, during a read transaction, the check bits are sent to the memory controller along with the data on the data mask (DM) signal lines. In a second mode, an unmasked write transaction is defined where the check bits are sent to the memory component on the data mask signal lines. In a third mode, a masked write transaction is defined where at least a portion of the check bits are sent from the memory controller on the data signal lines coincident with an asserted data mask signal line. By sending the check bits along with the data, the EDC code can be used to detect and correct errors that occur between the memory component and the memory controller.

Memory component with error-detect-correct code interface

The embodiments herein describe technologies of initializing resistive memory devices (e.g., non-volatile and volatile memory devices). In one method, a first voltage is applied across a resistance change material of a memory cell to form an initial filament and multiple cycles are performed to condition the initial filament. Each of the multiple cycles includes: applying a second voltage with a first polarity across the resistance change material; and applying a third voltage with a second polarity across the resistance change material.

Techniques for initializing resistive memory devices by applying voltages with different polarities

Control logic within a memory control component outputs first and second memory read commands to a memory module at respective times, the memory module having memory components disposed thereon. Interface circuitry within the memory control component receives first read data concurrently from a first plurality of the memory components via a first plurality of data paths, respectively, in response to the first memory read command, and receives second read data concurrently from a second plurality of the memory components via a second plurality of data paths, respectively, in response to the second memory read command, the first plurality of the memory components including at least one memory component not included in the second plurality of the memory components and vice-versa.

Self-annealing data storage system

Growing community of inventors

Monte Sereno, CA, United States of America

Brent Steven Haukness