General Electric Company

United Technologies Corporation

Brenda Zhang

Raymond K Seymour

Michael C Guerrette

Henry Hall Mason, Jr

Eleanor D Kaufman

Takao Fukuda

Kevin J Fuhr

Daniel C Nadeau

Steven G Lemieux

Frederick W Glabau

Ray Seymour

Douglas Tilghman

Murali Magham

Doug Tilghman

Single pole arc fault circuit breaker

In an exemplary embodiment of the invention, a dual test mechanism is presented for use in a circuit breaker. More specifically, the dual test mechanism includes a dual test button which comprises a single switch for testing both the AFCI and GFCI circuits of the breaker. The test mechanism includes a circuit board, which forms a part of the circuit breaker, and a test button assembly which includes a test button and signaling components which are electrically connected to the circuit board.

Circuit breaker with a dual test button mechanism

Growing community of inventors

West Hartford, CT, United States of America

Brenda Zhang