Leland Stanford Junior University

Brannon Klopfer

Mark A Kasevich

Adam Bowman

Marian Mankos

Stewart A Koppell

Thomas Juffmann

Improved resolution of a time-varying optical measurement is provided with optical intensity modulator(s) having a bandwidth greater than that of the detector array(s). The modulator configuration can have high photon collection efficiency, e.g. by using polarization modulation to split the incident light into several time-gated channels.

Nanosecond imaging methods using optical modulators

Improved resolution of a time-varying optical image is provided with a wide field optical intensity modulator having a bandwidth greater than that of the detector array(s). The modulator configuration can have high photon collection efficiency, e.g. by using polarization modulation to split the incident light into several timegated channels.

Wide-field nanosecond imaging methods using wide-field optical modulators

Improved aberration correction in multipass electron microscopy is provided by having Fourier images of the sample (instead of real images) at the reflection planes of the resonator. The resulting &#x2212;1 magnification of the sample reimaging can be compensated by appropriate sample placement or by adding compensating elements to the resonator. This enables simultaneous correction of lowest order chromatic and spherical aberration from the electron objective lenses. If real images of the sample are at the reflection planes of the resonator instead, only the lowest order chromatic aberration can be corrected.

Growing community of inventors

Stanford, CA, United States of America

Brannon Klopfer