Micron Technology Incorporated

Brandon Roth

Sujeet V Ayyapureddi

Manoj Sinha

Eric A Becker

Scott Schafer

Tyler J Gomm

Scott D Van De Graaff

There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system including a temperature sensor that includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

System and method for automatically calibrating a temperature sensor

Apparatus, systems, and methods disclosed herein may initialize a delay-locked loop (DLL) or phase-locked loop (PLL) to achieve a locked condition and may then initiate a quiescent mode of operation. Quiescent operation may be achieved by breaking a feedback loop associated with the DLL or PLL to prevent updates to a variable delay line associated with the DLL and/or to a variable frequency oscillator associated with the PLL. An output clock phase associated with the DLL or PLL may thus be held substantially constant following a DLL initialization period. Additional embodiments are disclosed and claimed.

Locked-loop quiescence apparatus, systems, and methods

This disclosure relates to delay line test circuits and methods. In one aspect, an integrated circuit (IC) can include a plurality of delay lines, a selection circuit, a delay comparison circuit, and a control circuit. The plurality of delay lines can generate a plurality of delayed clock signals, and the selection circuit can include a plurality of inputs configured to receive at least the plurality of delayed clock signals. The selection circuit can generate a first output clock signal and a second output clock signal by selecting amongst signals received at the plurality of inputs based on a state of a selection control signal. The delay comparison circuit can compare a delay of the first output clock signal to a delay of the second output clock signal and can generate a delay comparison such as a pass/fail flag based on the result. The control circuit can generate the selection control signal.

Apparatus and methods for delay line testing

There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system made up of a temperature sensor which includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.

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Boise, ID, United States of America

Brandon Roth