Micron Technology Incorporated

Brandon R Nixon

Eugene Dvoskin

Vehid Suljic

Daniel James Gunderson

A known randomized data pattern at a predetermined reference voltage of the internal oscilloscope is inputted to an internal oscilloscope of the receiving device for each delay tap element of a plurality of consecutive delay tap elements applied to a system clock of a receiving device. A first delay tap element among the plurality of consecutive delay tap elements in which an output of the internal oscilloscope matches the known randomized data pattern is identified. Responsive to identifying the first delay tap element, a last delay tap element among the plurality of consecutive delay tap elements in which the output of the internal oscilloscope matches the known randomized data pattern is identified.

Measuring a timing margin of a memory device using an internal oscilloscope

A health check manager may detect a trigger for a capacitor health check for a memory sub-system. The health check manager may determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager may perform the capacitor health check in accordance with the start time.

Capacitor health check

Methods, systems, and devices for a capacitor health check are described. A health check manager may detect a trigger for a capacitor health check for a memory sub-system. The health check manager may determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager may perform the capacitor health check in accordance with the start time.

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Meridian, ID, United States of America

Brandon R Nixon