Electro Scientific Industries, Inc.

Brandon John McCurry

Brian C Johansen

Robert M Pailthorp

Kenneth V Almonte

Spencer Barrett

Embodiments of an apparatus for measuring the leakage current of capacitive components is taught. One embodiment includes a first stage amplifier configured to receive an input from a serially-connected capacitive component at an inverting input and a feedback resistor in a feedback path of the first stage amplifier. A resistance value of the feedback resistor is programmable based on an expected value of the leakage current and a corresponding voltage output.

Programmable gain trans-impedance amplifier overload recovery circuit

An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical test setup and calibration of the electronic testing machine includes a plate having at least one contact per track movable between test positions to electrically insert a test device selectively between any one contact pair, and a control program. The test device can be selected from a group consisting of a volt meter, a current meter, a precision voltage/current source, a calibration resistor, and a calibration capacitor. The control program can perform at least one test function through the plate. The test function can be selected from a group consisting of alignment verification, voltage/current source verification, insulation resistance (IR) leakage measurement verification, part-present contact check verification, capacitance and dissipation (CD) measurement verification, IR/CD compensation, and IR/CD calibration.

Electrical tester setup and calibration device

Thermoelectric effects that occur during laser trimming of resistors () are resolved by taking voltage measurements. The voltage attributed to laser heating on a resistor () during a low-power simulated trim () is used to determine a relatively thermal-neutral location () on the resistor (). A trimming-to-value operation can then be performed on all like resistors (). Voltage measurements can also be taken before and after every pulse in a trimming operation to establish thermal deviation information that can be used to offset the desired trim value against which resistor measurement values are compared. Spatially distant or nonadjacent resistors () in a row or column can also be trimmed sequentially to minimize heating effects that might otherwise distort resistance values on adjacent or nearby resistors ().

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Portland, OR, United States of America

Brandon John McCurry