Seagate Technology Incorporated

Bradley John Gill

Abhay Tejmal Kataria

Christopher R Fulkerson

Brian John Higley

Kenneth J Ordes

A method and system for providing autonomous event logging and retrieval for failure analysis. In one implementation, storage device firmware monitors and records events (e.g., storage device errors and/or failures) to the storage device flash in substantially real time from power on of the storage device to power off. Additionally, diagnostic data relating to an event, including a time stamp and storage device environmental conditions are recorded. The logged event data may be utilized to streamline failure analysis by determining whether the storage device failed and if so, when the storage device failed and what the conditions of the storage device were at the time of the failure. Such information may be used for failure, warranty, integrator, and/or troubleshooting analysis.

Autonomous event logging for drive failure analysis

Methods and devices are provided for managing the transitions between operating modes in a data device. In an illustrative example, a method includes storing, in a control system for a device, a value for a first interval of time. The value indicates a minimum interval of time required for the device to remain in a lower power operating mode to provide energy savings at least equal to an energy cost associated with transitioning between the lower power operating mode and a higher power operating mode. The method further includes receiving a signal that instructs the device to transition from the lower power operating mode to the higher power operating mode. The method also includes ensuring that the device has remained in the lower power operating mode for at least as long as the first interval of time before it transitions to the higher power operating mode.

Energy-efficient transitioning among device operating modes

A method and system for providing programmable self-testing of a data storage device comprises selecting one or more host programmable tests stored in memory in the data storage device by setting data in a first log in memory of the data storage device. Parameters for execution of the one or more host programmable tests are set by setting one or more values in a second log in memory of the data storage device. The one or more host programmable tests on the data storage device are then executed. Results of the one or more host programmable tests are stored in a third log in memory of the data storage device.

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Longmont, CO, United States of America

Bradley John Gill