Micro Component Technology, Inc.

Bradley D Slye

David A Johnson

An apparatus for decoupling one contact (40) of an integrated circuit device (12) from a primary power source provided by a tester. The apparatus includes a rack mount (58) applied over each of two pluralities of probe fingers (16) which, together with other structure, provide electronic communication between the contacts (40) of the device (12) being tested and the primary power soruce. Each of the mounts (58) has a plurality of recesses (60) formed therein for receipt of various chip capacitors (92) and shorting elements (94). The recesses (60) pass fully through their respective rack mounts (58), and a contact strip (78) is positioned in an overlying relationship to a corresponding rack mount (58) to secure the chip capacitors (92) and shorting elements (94), selectively inserted into the various recesses (60), in operative electronic engagement with probe fingers (16) corresponding to the recesses (60) in which the various capacitors (92) and shorting elements (94) are received. Projections (86) extending from the contract strips (78) are provided for this purpose. Electronic communication between the various pins (40) is completed by providing a decoupling strap (82) bridging a gap between opposite, facing contact strips (78).

Decoupling apparatus for use with integrated circuit tester

An impedance matching block (16, 42, 92) for multi-pin connectors (10, 36, 104). A male connector member (12, 38) carrying signal male pins (18, 20) is mated to a female connector member (14) having signal female pins (24, 26), the male pins (18, 20) being received in corresponding female pins (24, 26). The impedance matching block (16) is interposed between male connector member (12) and female connector member (14). The block (16) is provided with impedance matching holes (32, 34) through each of which holes (32, 34) one paired combination of male and female pins (18, 20, 24, 26) passes coaxially.

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Golden Valley, MN, United States of America

Bradley D Slye