Teradyne, Inc.

Bradley A Phillips

Jan Paul Antonie Van Der Wagt

Anthony J Suto

Jason A Messier

Ron Sartschev

Brian L Massey

Peter J D'Antonio

Kyle L Klatka

An example method performed for a circuit path includes: receiving signals in the circuit path; and controlling states of the signals in the circuit path based on skews produced by circuits electrically connected in series in the circuit path. The states are controlled by inverting or not inverting the signals in the circuit path so that skews produced by different circuits in the circuit paths at least partially cancel.

Reducing timing skew in a circuit path

An example process includes: powering, via a power supply, an active-matrix display panel comprised of picture elements; and identifying, based on an output of the power supply, one or more picture elements in the active-matrix display panel that are potentially defective. The example process may also include identifying, among one or more of the picture elements that are potentially-defective, one or more picture elements that actually are defective.

Identifying potentially-defective picture elements in an active-matrix display panel

Example circuitry includes: a first sampling circuit configured to operate based on a first clock signal, to receive data, and to sample the data, where the first clock signal is calibrated to compensate for a first timing error in a rising edge of the data; a second sampling circuit configured to operate based on a second clock signal, to receive the data, and to sample the data, where the second first clock signal is calibrated to compensate for a second timing error in a falling edge of the data; and a third sampling circuit to receive the data and a third clock signal, to sample the data based on the third clock signal to produce sampled data, and to control an output of the circuitry based on the sampled data to be either an output of the first sampling circuit or an output of the second sampling circuit.

Deskew of rising and falling signal edges

Calibrating test equipment may include: aligning timing of a first group of channels in the test equipment; aligning timing of a second group of channels in the test equipment, with the second group of channels being different from the first group of channels; determining a misalignment in timing between a first channel and a second channel, with the first channel being from the first group of channels, and the second channel being from the second group of channels; and compensating, for the misalignment, channels in at least one of the first group or the second group.

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Westlake Village, CA, United States of America

Bradley A Phillips