Intel Corporation

Bradley A Bloechel

Luiz M Franca-Neto

Charles E Dike

Techniques and structures are disclosed for providing interface and radio frequency (RF) network between a microelectronic device and an antenna.

Apparatus to provide connection between a microelectronic device and an antenna

Techniques for testing devices include generating event signals and producing response signals in a device under test (DUT) in response to the event signals. The event signals are stored in a holding circuit. The DUT is evaluated based on the response signals from the DUT and stored event signals received from the holding circuit.

Device testing using a holding-circuit

A method and apparatus for minimizing a disparity of set and clear bits transmitted across a serial line is disclosed. The method operates by determining a line disparity by examining n-bit datawords that are transmitted. The method also determines a dataword disparity is determined for a dataword yet to be transmitted. The dataword yet to be transmitted is then inverted before transmission if the line disparity and the dataword disparity have the same sign.

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Beaverton, OR, United States of America

Bradley A Bloechel