Intel Corporation

Brad L Inman

Jan P Peeters Weem

Stephen Sturges

Rob J Hensel

Robert C Hash

In embodiments of the present invention, an optical device tester performs stressed eye testing on several optical receivers and transmission and dispersion penalty testing on optical transmitters at a variety of data rates wavelengths using single mode optical signals and multimode optical signals using a variety of supply voltages and temperatures.

Optical transceiver tester

Low cost test for Integrated Circuits or electrical modules using a reconfigurable logic device is described. In one embodiment, the invention includes configuring a reconfigurable logic device to comply with input standards of a device under test, applying test signals to the device under test, detecting output results of the device under test, and analyzing the detected output results.

Low cost test for IC's or electrical modules using standard reconfigurable logic devices

A method and apparatus for permitting diagnostics in a PC is described. Signals, imperceptible to a user, are transmitted through the LED used to indicate on/off power status. A small hand-held device may be used for detecting and interpreting the signals and to provide a visual indication to the user of a particular problem.

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Hillsboro, OR, United States of America

Brad L Inman