Cascade Microtech, Inc.

Brad Froemke

John L Dunklee

Peter Douglas Andrews

Anthony James Lord

Rod Jones

Jeff Spencer

Craig Stewart

Peter Navratil

Gavin Fisher

Pete McCann

Scott Runbaugh

An improved chuck with lift pins within a probe station. The chuck assembly may have an outer periphery and an upper surface. The lift pins may be positioned within the periphery of the chuck assembly and may be capable of relative vertical movement with respect to the upper surface of the chuck assembly.

Chuck with integrated wafer support

A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A percentage of the top surface of the second platen terminating into free space.

Probe station with two platens

An improved chuck assembly with lift pins. The chuck assembly may have an outer periphery and an upper surface. The lift pins may be positioned within the periphery of the chuck assembly and may be capable of relative vertical movement with respect to the upper surface of the chuck assembly.

An improved chuck with lift pins within a probe station.

A probe station.&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;&ensp;ABSTRACT IS TOO SHORT. We have to do something to make this paragraph longer so that Xyvision will allow us to print it out so I am adding some 50 extra words so that it will hopefully let us print it out so that we can proof the file. PLEASE REMOVE THIS EXTRA DATA.

Growing community of inventors

Portland, OR, United States of America

Brad Froemke