Via Technologies, Inc.

Bowei Hsieh

Ming-Shi Liou

Hsiang-Che Hsu

Jiin Lai

A chip operating method is provided which includes enabling a transmission mechanism or a receiving mechanism of the chip while normally operating the chip. The method further includes enabling both of the transmission mechanism and the receiving mechanism of the chip while testing the chip.

Method and system for testing chips

Method and related system for testing a chip with high speed I/O functions are provided. The testing method of a chip includes the steps of: receiving a testing signal from a low speed bus; then transmitting the testing signal according to a transmission control signal; then receiving the testing signal according to a receiving control signal; and comparing the transmitted testing signal and the received testing signal to identify the I/O functions of the chip.

A method for utilizing the multi-channel transmission bandwidth in an asymmetrically arranged memory is provides. The present invention defines symmetrically arranged parts of the memory ranks of the memory as a virtual ranks. If data is stored in symmetrically arranged memory ranks of the memory, channels corresponding to the symmetrically arranged memory ranks could be simultaneously utilized to transfer data. If data is stored in an asymmetrically arranged memory rank of the memory, the channel corresponding to the asymmetrically arranged memory rank could only be utilized to transfer data.

Method and related apparatus for accessing memory

A method and related apparatus for adjusting/calibrating timing of memory signals. In a preferred embodiment of the invention, reference signals of the same frequency and different phase are generated by a phase-lock loop. These reference signals are used to trigger sampling of signals for generating signals of different timing/delay; then timing/delay of memory signals, such as clock, command, data and data strobe, can be adjusted and calibrated. In this way, the invention can avoid the use of delay lines while adjusting/calibrating memory signals, so as to reduce the negative effects of characteristics shift and variation of delay lines.

Method and related apparatus for adjusting timing of memory signals

An adjusting circuit for adjusting timings of memory signals of a computer system is provided. The adjusting circuit includes: a clock generator for generating a plurality of reference signals, all having the same frequency but different phase; a multiplexing unit connected to the clock generator for receiving the reference signals, wherein the multiplexing unit selects a first reference signal according to a selecting signal; and an adjusting unit connected to the multiplexing unit for receiving a signal and delaying to output the signal according to the first reference signal selected by the multiplexing unit.

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Taipei Hsien, Taiwan

Bowei Hsieh