Enablence Holdings LLC

Boumy Sayavong

Desmond Rodney Lim

Kevin Kidoo Lee

Christian Hoepfner

Wang-Yuhl Oh

A method for testing an optical chip, while the optical chip is still on a wafer, utilizing an optical probe, includes the steps of creating an access point on the wafer adjacent the optical chip. The optical chip having a waveguide having an axis. A portion of the waveguide is removed to form the access point such that light exiting the planar optical waveguide is directed in a direction substantially different from the axis of the waveguide. An optical probe is placed along a propagation path of the exiting light to optically couple the optical probe and optical chip.

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Ottawa, Canada

Boumy Sayavong