O-Net Communications (Shenzhen) Limited

Bouchaib Hraimel

Zining Huang

Jiaxi Kan

A test device for a TO-CAN laser includes a test socket, a coaxial waveguide substrate, and a test printed circuit board (PCB). The test socket comprises a coaxial waveguide tube accommodating a signal output pin of the TO-CAN laser and an electric-conducting slot accommodating a signal input pin of the TO-CAN laser. The coaxial waveguide substrate is respectively connected with a coaxial waveguide pin of the test PCB and the coaxial waveguide tube of the test socket. An electric-conducting slot pin of the test socket is connected with corresponding control pins of the test PCB.

Test device for a TO-CAN laser and test system for a TO-CAN laser

The present disclosure provides a laser device, where the laser device comprises a substrate, a seed laser disposed on the substrate, and a radiofrequency coil. Two connection ends of the radiofrequency coil are connected with corresponding pin ends of the seed laser, respectively.

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Shenzhen, China

Bouchaib Hraimel