Huawei Technologies Co., Limited

Borui Li

Lei Zhou

Shengping Li

Kuo Zhang

Embodiments of this application provide a method and an apparatus for obtaining a transmitter test parameter, and a storage medium. The method includes: performing waveform sampling on an optical signal sent by a transmitter, to obtain a sampled electrical signal, obtaining a first noise amount associated with the sampled electrical signal based on a preset initial noise ratio parameter and a level amplitude of the sampled electrical signal, and obtaining a second noise amount associated with an ideal electrical signal based on the initial noise ratio parameter and a level amplitude of the ideal electrical signal. According to the application, a noise amount associated with a level amplitude of a sampled electrical signal is obtained without limiting a type of a receiver that performs a consistency test on a transmitter by using a transmitter test parameter.

Growing community of inventors

Wuhan, China

Borui Li