Intel Corporation

Freescale Semiconductor,inc.

Boris Razmyslovitch

Brandt Braswell

Michael L Gomez

Gerald P Miaille

Uday Padmanabhan

Christian J Rotchford

Jiangbo Gan

Richard Murphy

Dhruv S Dani

Aniket Bharaswadkar

Described is an apparatus which comprises: a circuitry to selectively switch between a functional clock or a scan clock; a first plurality of circuitries to generate a plurality of pulses according to the scan or functional clocks; and a second plurality of circuitries to generate a plurality of clocks according to the plurality of pulses, wherein the plurality of clocks are for testing one or more circuitries.

Apparatus and method for at-speed scan test

Methods and corresponding systems for calibrating a digital-to-analog converter include selecting first and second code regions in the digital-to-analog converter, wherein the first and second code regions are separated by a boundary. Thereafter a waveform sequence is input into the digital-to-analog converter, wherein the waveform sequence has a zero offset at the boundary. Then a relative compensation value between the first and second code regions is adjusted to reduce a distortion in an output of the digital-to-analog converter. A magnitude of a third harmonic distortion of the waveform sequence can be used to measure distortion in the output. Adjusting the relative compensation can include converting the output of the digital-to-analog converter to a digital sequence, filtering the digital sequence, and measuring a harmonic distortion in the digital sequence.

Calibrating a digital-to-analog converter

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Chandler, AZ, United States of America

Boris Razmyslovitch