L-3 Communications Security and Detection Systems Corporation

Tekscan, Inc.

L-3 Security & Detection Systems, Inc.

Leidos Security Detection & Automation, Inc.

Boris Oreper

Andrew Dean Foland

Richard Franklin Eilbert

Nikolay Rolshud

Vitaliy Ziskin

Douglas Perry Boyd

Michael R Gambini

Charles Malacaria

Jeffrey H Stillson

Andrew D Foland

Mark Lowe

Thomas David Plamondon

Michael H Schmitt

Jay Winters

John Brenneman

Paul Howard

Thomas Warnick

Charles McWilliams

Anthony Coviello

Kenneth E Prather

Prabhav Morje

Thomas D Plamondon

Methodologies, systems, apparatus, and non-transitory computer-readable media are described herein to facilitate acquisition of volumetric data and volumetric image reconstruction. An imaging system can be configured to transport an object at a speed relative to the scan path of an X-ray source such that insufficient measurement data is collected for classically complete geometrical coverage. Iterative image reconstruction techniques may be used to generate volumetric images based on measured volumetric data of at least a portion of the object.

Systems and methods for image reconstruction at high computed tomography pitch

A system and method for imaging objects with a sparse detector array that includes fewer detectors than conventional x-ray scanning systems. The sparse detector array is positioned to receive x-ray radiation from the at least one x-ray source after passing through an inspection area. The sparse detector array includes a plurality of rows of detector elements, wherein at least some of the plurality of rows are separated by gaps such that the at least some of the plurality of rows are non-contiguous. An iterative reconstruction process is used to determine a volumetric image of the object from the radiation measurements recorded by the detectors in the sparse detector array.

X-ray imager with sparse detector array

A signal is reconstructed from multiple radiation sources. Data detected by a detector is accessed. The data includes a combined representation of radiation emitted concurrently from two sources of radiation. A representation of the radiation emitted from one of the two sources of radiation is determined from the data.

Single radiation data from multiple radiation sources

A system and method for forming volumetric images of an imaged object based on multiple radiation measurements of the object taken from different angles. A first volumetric image of the object may be calculated using a direct reconstruction method from a plurality of radiation measurements of the object. At least one iteration of an iterative reconstruction method may be performed to compute a second volumetric image of the object. The iterative reconstruction method may be initialized with the first volumetric image of the object.

Reconstruction method using direct and iterative techniques

A dual energy inspection system that generates X-rays with an electron beam scanned over targets. A switchable voltage source that can be change its voltage output may cause X-rays to be generated at different energies. This X-ray generation subsystem is controlled by a sequencer that provides beam steering and shaping control inputs that may be dependent on the voltage provided by the voltage source. In another aspect, the dual energy inspection system may use multiple types of detectors, each sensitive to X-rays of a different energy. A relatively small number of detectors sensitive to one energy level is provided. Nonetheless, dual energy measurements may be made on objects within an item under inspection by identifying points that, for each object of interest, provide a low interference path to one of those detectors. Measurements made with radiation emanating from those points are used for dual energy analysis of those objects.

Dual energy imaging system

In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.

Methods and apparatus for e-beam scanning

A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.

Irradiation system including an electron-beam scanner

A distribution of heavy particle stopping power is be determined. A distribution of effective atomic number of a three-dimensional space is accessed, and a distribution of an x-ray stopping power of the three-dimensional space is accessed. A conversion is applied to the distribution of the effective atomic number and the distribution of x-ray stopping power. A distribution of the heavy particle stopping power of the three-dimensional space is generated based on the conversion, the heavy particle stopping power being an indication of a depth of penetration for a heavy particle incident on the three-dimensional space.

Determination of heavy particle stopping power

X-ray radiation is generated at a target that emits x-ray radiation in response to being struck by accelerated electrons, the electrons being emitted by a cathode that emits electrons in response to being illuminated by electromagnetic radiation from a source, and the x-ray radiation is moved by orienting a surface that directs the electromagnetic radiation from the source toward the cathode.

Scanning X-ray radiation

An apparatus may comprise a frame supporting at least first and second skewed radiation sources and at least first and second radiation detectors. The first and second radiation detectors may be substantially non-contiguous such that a substantial gap exists between the first and second radiation detectors that is free of any radiation detectors. Each of the first and second radiation detectors may also configured and arranged to detect radiation emitted by each of the first and second skewed radiation sources.

Radiation scanning systems and methods

Various novel apparatuses and methods for generating X-rays are disclosed. In some embodiments, for example, an apparatus may be configured and arranged so that, for at least one interception point on a particular portion of a scan path on a surface of a target along which a steering element steers an accelerated electron beam (e-beam), both an angle and its complement between a line corresponding to a direction in which the accelerated e-beam is traveling at the interception point and a line oriented normal to the surface of the target at such interception point are greater than forty five degrees.

Compact e-beam source for generating X-rays

A system may comprise a cathode, a target, one or more switches, and a conductive element. The cathode may be configured and arranged to generate an electron beam, and the target may be configured and arranged to emit radiation when electrons in the electron beam impact the target after being accelerated by an energy source. The one or more switches may be configured and arranged to apply either a first voltage or a second voltage from a power supply between the cathode and the target. The conductive element may be disposed between the cathode and the target so as to inhibit the electron beam generated by the cathode from reaching the target when a signal is applied to the conductive element.

Selective generation of radiation at multiple energy levels

A method for operating an inspection system is disclosed in which an item under inspection may be moved between radiation sources and detectors illuminated by the sources. The radiation sources may be positioned such that radiation from at least some of the sources impinge on the radiation detectors, forming acute angles with respect to a plane having a normal direction coinciding with the first direction that are substantially in excess of three degrees. Data accumulated by the radiation detectors may be processed to form a three-dimensional tomographic data image of at least a portion of the item under inspection. The processing may be performed using an algebraic reconstruction technique using an inverse system matrix. The inverse matrix can be derived without first computing a transpose of the system matrix.

Tomographic imaging systems and methods

A dual energy X-ray source for use in an explosive detection system includes only a single power supply and only a single X-ray tube. The X-ray tube includes only two electron guns and only a single anode. Each electron gun has its own grid and cathode. The X-ray source switches between producing a higher energy X-ray and producing a lower energy X-ray at a frequency of at least 4000 Hz.

Growing community of inventors

Newton, MA, United States of America

Boris Oreper