Samsung Electronics Co., Ltd.

Samsung Display Co., Ltd.

Bong-Won Lee

Kyu-Sung Kim

Joong-Hun Kwon

Ji-Hyun Ahn

Seung-Bae Kang

Jeong-Min Park

Sang-Gab Kim

June-Seok Kim

In-Won Jong

Hyun-Eok Shin

Jin-Seock Kim

Ji-Young Kang

Jong-Hee Park

Ji-Eun Kim

Jee-Yeun Wang

Dae-Won Kim

So-Ra Kim

Hee-Kyung Jeon

Cheol-Ho Yu

Jong-Yun Kim

Han-Su Kim

Min-Hwa Jung

Min-Hyuk Kim

Kyoung-Sik Yoon

Jin-Taek Kim

Chan-Woo Yang

Myoung-Hwan Han

An OLED display device includes a substrate including a display region and a pad region, a display structure in the display region on the substrate, and a pad electrode structure in the pad region on the substrate, the pad electrode structure having a first pad electrode on the substrate, a first insulation layer covering opposite lateral portions of the first pad electrode and exposing a portion of an upper surface of the first pad electrode, a second pad electrode on the first pad electrode and on the first insulation layer, the second pad electrode having a step portion where the first pad electrode and the first insulation layer are overlapped, and a third pad electrode on the second pad electrode and on the first insulation layer, the third electrode covering the second pad electrode.

Organic light emitting display device

A flexible electrode for a display device may include a conductive structure including a lower conductive pattern disposed on a substrate and an upper conductive pattern disposed on the lower conductive pattern, and an electrode layer disposed on the substrate, the electrode layer being adjacent to the conductive structure. A width of a top surface of the lower conductive pattern may be less than a width of a bottom surface of the upper conductive pattern.

Flexible electrode for display device

Organic light emitting diode display device

A test structure includes a terminal pattern, a first extending part, a second extending part and a measuring part. The terminal pattern includes a first terminal part, a second terminal part, a third terminal part and a fourth terminal part sequentially disposed and spaced apart from each other in a first direction. The first extending part is connected to the first terminal part and the second terminal part. The first extending part extends in a second direction crossing the first direction. The second extending part is connected to the third terminal part and the fourth terminal part. The second extending part extends in the second direction. The measuring part partially overlaps the first extending part and the second extending part.

Test structure, array substrate having the same and method of measuring sheet resistance using the same

Disclosed is a method of manufacturing an oxide semiconductor device, including: forming a gate electrode on a substrate; forming a gate insulating layer on the gate electrode; forming an active pattern on the gate insulating layer; forming a first mask pattern on the gate insulating layer and the active pattern; forming an insulating interlayer on the gate insulating layer, the active pattern, and the first mask pattern; forming a second mask pattern on the insulating interlayer, the second mask pattern comprising an opening that exposes a region where the first mask pattern is formed; forming contact holes exposing portions of the active pattern by patterning the insulating interlayer using the first mask pattern and the second mask pattern; and forming a source electrode and a drain electrode on the gate insulating layer by filling the contact holes, the drain electrode spaced apart from the source electrode.

Method of manufacturing an oxide semiconductor device and method of manufacturing a display device having the same

Display screen or portion thereof with graphical user interface

Display screen with graphical user interface

Mobile terminal with graphical user interface

Transitional image for a mobile phone

Growing community of inventors

Seoul, South Korea

Bong-Won Lee