Cypress Semiconductor Corporation

Bogdan Samson

Iulian Constantin Gradinariu

Vijay Raghavan

Jayant Ashokkumar

A circuit includes a biasing circuit that includes a diode stack coupled to a first node. The biasing circuit can output a biasing signal on the first node. The biasing circuit also includes a transistor, a timer component and a current source. An input of the timer component is coupled to receive an isolation signal. The current source is configured to inject current for a period of time into the diode stack in response to a transition of the ISO signal between a first voltage and a second voltage. The biasing circuit also is configured to output a signal to a level shifter to hold an output of the level shifter in a known state for a specified amount of time after power-up of the circuit for proper operation of the level shifter.

Biasing circuit for level shifter with isolation

A circuit includes a biasing circuit that includes a load circuit coupled to a first node. The biasing circuit can output a biasing signal on the first node. The biasing circuit also includes a timer component and a current source. An input of the timer component is coupled to receive an isolation signal. The current source is configured to inject current for a period of time into the load circuit in response to a transition of the ISO signal between a high voltage and a low voltage. The biasing circuit also includes circuitry to generate an isolation delayed (ISO_DEL) signal. The ISO_DEL signal has a high voltage in response to the biasing signal being within a first threshold level and the ISO_DEL signal has a low voltage in response to the biasing signal being within a second threshold level. The biasing circuit outputs the ISO_DEL signal.

An address transition detector (ATD) system is provided with an integrator, a feedback circuit and an output circuit. The integrator has an enhanced architecture that ensures a fast output signal switching, low power consumption during the integration time, fast output transition at the end of the integration time and compensates the delay variations over process, voltage and temperature (PVT) fluctuations. The ATD system can be used in any asynchronous memory. In addition, the ATD integrator can be employed as a standalone circuit for use whenever a signal transition is to be delayed.

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Colorado Springs, CO, United States of America

Bogdan Samson