Microchip Technology Inc.

Bogdan Bolocan

Andrea Panigada

Ezana Haile

Jason Remple

Pat Richards

A method and apparatus for measuring an unknown impedance. The apparatus comprises a first input to receive a first signal generated by a first portion of a sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance to vary based upon a phenomenon to be measured by the sensor circuit. The apparatus also comprises a second input to receive a second signal generated by a second portion of the sensor circuit, the second portion of the sensor circuit comprising a known impedance and a second known resistance. And the apparatus comprises control logic to, based on a difference in time at which each of the first input and the second input reach a reference voltage, determine a measurement of the sensor circuit.

Enhanced impedance measurement using CTMU

A slave device includes an SPI bus with a mode detection circuit configured to detect an SPI operating mode that has been applied by a master device. The slave device is configurable to operate in a first or a second mode depending on the detection of the SPI operating mode as applied by the master device.

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Eggenstein-Leopoldshafen, Germany

Bogdan Bolocan