Apple Inc.

Sun Microsystems, Inc.

Oracle America, Inc.

Bo Tang

Edgardo F Klass

Ajay Bhatia

Shingo Suzuki

Karthik Rajagopal

Ilyas Elkin

Honkai Tam

Georgios K Konstadinidis

Andrew J Demas

Huaimin Li

Geoffrey M Pilling

Abhijit D Choudhury

A method of generating an area efficient power switch cell includes receiving, by a cell library design tool, a specification of a power switch circuit to be established as a power switch cell in a cell library. The cell library design tool also receives one or more attributes of the power switch cell including a height of the cell boundary and receiving, by the cell library design tool, a layout placement constraint requiring the power switch cell to be placed in a semiconductor layout so as to bridge two parallel rows of doped wells. The parallel rows of doped wells are interleaved with doped substrate and the doping of the wells is of a different type than that of the substrate. Based on the specification of the power switch circuit, the one or more attributes, and the layout placement constraint, the cell library design tool generates the power switch cell.

Area efficient power switch

A dual path source synchronous interface is disclosed. In one embodiment, a source synchronous interface includes a transmitter coupled to serially receive data from a first functional circuit block, and a receiver coupled to provide data serially to a second functional circuit block. Data is conveyed to the transmitter on a single signal line, and similarly, from the receiver on another single signal line. The transmitter is coupled to the receiver by two signal lines. The serial data received by the transmitter may be separated into two streams of alternating bits, e.g., a first bit is transmitted on one signal line, the next bit is transmitted on the other signal line, and so forth. At the receiver, the alternating bit streams may be re-combined into a single bit stream for transfer to the second functional circuit.

Dual path source synchronous interface

A system including control logic, a voltage reference, a sense amplifier, and a voltage supply circuit is presented. The sense amplifier may be configured to detect a current state of the voltage supply circuit output compared to the reference voltage. The voltage supply circuit may be configured to capture and preserve the current state to be used as a previous state. The voltage regulator may be configured to compare the current state to one or more previous states and adjust the voltage regulator output based on the comparison. Control logic may be configured to enable the voltage reference output in response to a signal. Control logic may be configured to enable the sense amplifier at a time after the voltage reference is stable. Control logic may be configured to disable the voltage reference output in response to the sense amplifier generating an output.

SRAM regulating retention scheme with discrete switch control and instant reference voltage generation

A apparatus including a clock source and a comparison circuit is presented. The clock source may be configured to generate a clock signal. The comparison circuit may be configured select a first frequency of the clock signal and to receive a plurality of voltage signal inputs for comparison. The comparison circuit may be further configured to compare a voltage level of a first voltage signal input of the plurality of voltage signal inputs to a voltage level of a second voltage signal input of the plurality of voltage signal inputs responsive to an active edge of the clock signal. The comparison circuit may also be configured to determine a comparison value corresponding to the comparison of the voltage levels and to select a second frequency of the clock signal dependent upon the comparison value, in which the second frequency is different than the first frequency.

Voltage sampling scheme with dynamically adjustable sample rates

Embodiments of an apparatus are disclosed that may allow for the translation of signals from one power domain to another with well-balanced rise and fall times over a wide operational range. The apparatus may include an input buffer, a voltage shift circuit, and output circuit, and an output driver. The input buffer may be configured to generate a buffered version and delayed inverted version of an external signal at a first voltage level. The voltage shift circuit may be configured to generate two internal signals at a second voltage level dependent upon the output signals of the input buffer. The output circuit may be configured to generate two output driver signals at the second voltage level dependent upon the output signals of the voltage shift circuit. The output driver circuit may be configured to generate an output signal at the second voltage level dependent on the two output driver signals.

Balanced level shifter with wide operation range

A dual edge triggered flip flop can pass data values on a clock rising or falling edge. The dual edge triggered flip flop can be operated at half the clock speed of a single edge triggered flip flop and produce substantially the same throughput. The dual edge triggered flip flop may use less power than a single edge triggered flip flop due at least in part to the construction of an intermediate gate as a data interlock gate. The dual edge triggered flip flop may contain a plurality of master nodes, and is soft error hardened compared to a single edge triggered flip flop.

Low power and soft error hardened dual edge triggered flip flop

A number of scan flops clocked by a master clock may be used to constructing a scan chain to perform scan tests. During a scan test, data appearing at the regular data input of each scan flop may be written into a master latch of the scan flop during a time period when the scan control signal is in a state corresponding to a capture cycle. A slave latch in each scan flop may latch a value appearing at the regular data input of the scan flop according to a narrow pulse triggered by the rising edge of the master clock when the scan control signal is in the state corresponding to the capture cycle. The slave latch may latch the data provided by the master latch according to a wide pulse triggered by the rising edge of the master clock when the scan control signal is in a state corresponding to a shift cycle. This may permit toggling the scan control signal during either a high phase or a low phase of the master clock, and may also enable testing the pulse functionality of each scan flop.

Scan latch with phase-free scan enable

Circuits and methods for full rate data reception and transmission using half-frequency clock signals are disclosed. In one embodiment, a flop circuit includes a data input, a data output, and a clock input. The clock signal has a first frequency, while the flop circuit is configured to output data at a rate corresponding to a second frequency. In one embodiment, the second frequency is twice the first frequency. The flop circuit is configured to transmit a first data bit responsive to a first edge (e.g., a rising edge) of the clock signal and a second data bit responsive to a second edge (e.g., a falling edge) of the clock signal that is the next edge following the first edge. Accordingly, the flop circuit may effectively operate at the second frequency utilizing the clock signal at the first lower frequency.

Reduced frequency clock delivery with local recovery

A scannable latch circuit is disclosed. In one embodiment, the scannable latch circuit includes a master latch, a slave latch, and a gating circuit coupled between the master latch and the slave latch. The slave latch may be implemented to support scan-shifting for test operations. Scan data received by the master latch may be provided to the slave latch through the gating circuit. The gating circuit may enable data to be transferred from the master latch to the slave latch when a scan enable signal is asserted. When the scan enable signal is deasserted, the gating circuit may cause the slave latch to output a constant (i.e. unchanging) state, regardless of the state of data stored in the master latch. This may result in power savings by inhibiting the slave latch from making state changes when scan-shifting operations are not in progress.

Low power scannable latch

A synchronizer circuit includes a master stage and a slave stage. The master stage may include a first master latch coupled to receive a data input signal, and a clock signal. The master stage may also include a second master latch coupled to receive the data input signal, and a delayed version of the clock signal. The master stage may further include a pull-up circuit that may drive an output line of the master stage depending upon an output of each of the first master latch and the second master latch. The slave stage may include a slave latch having an input coupled to the output line of the master stage. The slave stage may provide an output data signal that corresponds to the captured input data signal and is synchronized to the receiving clock signal.

Low latency synchronizer circuit

A soft error recoverable storage element suitable for use in latches, flip-flops, static ram memory cells and microprocessor pipeline stages. The storage element employs a redundant copy of the stored data value and a feedback loop. One embodiment employs an interlocking four inverter loop with gating devices that blocks the propagation of a soft error induced change of state and causes the storage element to recover its original stored data state.

Soft error recoverable storage element and soft error protection technique

A synchronizer circuit for transferring data from a source clock domain to a target clock domain. A first latch in the target clock domain may capture a data value corresponding to current data received from the source clock domain. Under certain conditions, the first latch may enter into a metastable, or undefined logic state. A second latch may remain stable, and store a previous value corresponding to data that has most recently been transferred from the source clock domain to the target clock domain. The respective values output by the two latches may be compared by a detection circuit, and a value derived from the output value of the first latch and corresponding to the current data may be written to an output latch if the current data differs from the stored previous value. The detection circuit may also provide a defined logical value to the output latch even if the first latch is in a metastable state.

Growing community of inventors

Sunnyvale, CA, United States of America

Bo Tang