Shanghai Zhimeng Biopharma, Inc.

Kla Tencor Corporation

Bo Hua

Bo Liang

Huanming Chen

Zhijun Zhang

Qiu Jin

Gang Liu

Tian Xia

Robert M Danen

Santosh Bhattacharyya

Christopher Maher

Philip Measor

Devashish Sharma

A tetrahydro-1H-benzazepine compound as a potassium channel modulator, a preparation method, and a medicament containing the compound are provided. Specifically, the compound has the structure shown by formula A, in which the definitions of each group and substituent are described in the description. A preparation method for the compound and its use as potassium channel modulator are also described.

Tetrahydro-1H-benzazepine compound as potassium channel modulator, preparation method and use thereof

2-aminopyrimidine compounds and pharmaceutical compositions and uses thereof are provided. Specifically, the 2-aminopyrimidine compounds have a structure as shown in formula I. The compounds are suitable for use in the fields of anti-virus and anti-infection, as well as treatment of diseases such as autoimmune diseases and tumors.

2-aminopyrimidine compounds and pharmaceutical compositions and uses thereof

Disclosed are a compound having a neuroprotective effect, a preparation method therefor and a use thereof. Specifically, the compound has the structure shown by formula I, the definition of each group and substituent being as described in the description. Further disclosed are a preparation method for the compound and a use thereof for neuroprotection.

Compound having neuroprotective effect, preparation method therefor and use thereof

Methods and systems for discovery of defects of interest (DOI) buried within three dimensional semiconductor structures and recipe optimization are described herein. The volume of a semiconductor wafer subject to defect discovery and verification is reduced by storing images associated with a subset of the total depth of the semiconductor structures under measurement. Image patches associated with defect locations at one or more focus planes or focus ranges are recorded. The number of optical modes under consideration is reduced based on any of a comparison of one or more measured wafer level defect signatures and one or more expected wafer level defect signatures, measured defect signal to noise ratio, and defects verified without de-processing. Furthermore, verified defects and recorded images are employed to train a nuisance filter and optimize the measurement recipe. The trained nuisance filter is applied to defect images to select the optimal optical mode for production.

Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures

Growing community of inventors

Shanghai, China

Bo Hua