Telefonaktiebolaget Lm Ericsson (publ)

Björn Olsson

Sverker Sander

Per Ingelhag

Anders Aronsson

Fredrik Larsson

The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.

Optical electrical measurement system, a measurement probe and a method therefor

A first aspect provides in a supply voltage control module, a method of providing instructions for setting a supply voltage comprising obtaining information on a supply voltage need of a load and based on that information, determining a supply voltage that is to be provided to the load. Subsequently, an instruction is sent to a power supply module to supply the determined supply voltage to the load. A need for a supply voltage of a load, like an integrated circuit, may not only depend on design of the load, but also on parameters of the manufacturing process and the level of activity of the load. By obtaining information on a supply voltage need of the load and using that information to determine a supply voltage to be provided to the load, a feedback loop is created by instructing a point of load power supply to provide the supply voltage determined.

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Göteborg, Sweden

Björn Olsson