Infineon Technologies Ag

Björn Flach

Wolfgang Ruf

Martin Schnell

Andreas Logisch

Michael Schittenhelm

Monica De Castro Martins

Mónica De Castro Martins

Ana Leao

The invention provides a method for testing circuit units to be tested in a test apparatus, different identification units being assigned to the circuit units to be tested, the circuit units to be tested being connected to the test apparatus, a tester data stream including command blocks being output from the test apparatus, the tester data stream being compared with the identification units, the circuit unit to be tested, the identification unit of which matches the tester data stream output by the test apparatus, being activated and at least one command block for this circuit unit to be tested being processed in the circuit unit to be tested, whereupon the circuit unit to be tested is deactivated.

Circuit arrangement and method for driving electronic chips

An insertable calibration device for a programmable tester apparatus comprises at least one calibration unit and a control unit. The progammable tester apparatus is configured to test at least one electronic device with electronic circuits. The progammable tester apparatus comprises a holding device, contact-making devices for the electronic device, and tester channels for coupling in signals to the electronic device. The calibration unit is connected to a first tester channel to be calibrated. The calibration unit is configured to detect a calibration signal edge of a calibration signal that is transmitted by the tester apparatus at a certain transmission instant, to detect a reference signal edge of a reference signal that is transmitted by the tester apparatus via a second tester channel at a reference instant, to compare the instants at which the two signal edges arrive, and to output a comparison result. The control unit evaluates the comparison results and can be used to program the transmission instants in such a way that the instants at which the calibration signal edge and the reference signal edge arrive, for the compensation of signal propagation time differences, are substantially identical. The calibration device has the same form and connections as the electric device and is insertable into the holding device with an accurate fit instead of the electronic device.

Insertable calibration device

A tester for semiconductor components with a plurality of channels is connected to a specific semiconductor component in order to characterize the signal path between tester and semiconductor component under production conditions. The specific semiconductor component includes measuring units that are connected to connection contacts and in each case provide the functionality of a signal generator, a signal detector, a digital communication interface and a receiving unit for trigger signals. The specific semiconductor component further includes a trigger logic to convey trigger signals between the receiving unit of a first one and the signal generator or detector of a second one of the measuring units.

Semiconductor component, arrangement and method for characterizing a tester for semiconductor components

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Vila do Condo, Portugal

Björn Flach