Yangtze Memory Technologies Co., Ltd.

BiRuo Song

Yu Wang

The disclosure provides a power supply circuit, a memory, a testing device, a memory system and an electronic device, relates to the memory technologies, and may reduce the testing time of the memory and the footprint occupation of the memory. The power supply circuit can include a voltage adjusting circuit and an oscillation circuit. A first voltage output terminal of the voltage adjusting circuit is coupled with a power supply input terminal of a delay chain circuit in the memory and coupled with a power supply input terminal of the oscillation circuit. The voltage adjusting circuit is configured to output a first voltage to the delay chain circuit and the oscillation circuit via the first voltage output terminal. The oscillation circuit is configured to generate a clock signal corresponding to the first voltage. The voltage adjusting circuit is also configured to receive an adjusting signal for adjust the first voltage.

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Hubei, China

BiRuo Song