Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh

Gsi Helmholtzzentrum Fur Schwerionenforschung Gmbh

Birgit Schabinger

Dieter Winkler

Florian Maurer

Christina Trautmann

Bernd Wöllert

Joachim Brötz

Klaus Blaum

Stefan Ulmer

Wolfgang Quint

Joseba Alonso

A charged particle beam device for imaging and/or inspecting a sample is described. The charged particle beam device includes a beam emitter for emitting a primary charged particle beam; a retarding field device for retarding the primary beam before impinging on the sample, the retarding field device including an objective lens and a proxy electrode; and a first detector for off-axial backscattered particles between the proxy electrode and the objective lens. The charged particle beam device is adapted for guiding the primary beam along an optical axis to the sample for releasing signal particles. The proxy electrode includes one opening allowing a passage of the primary charged particle beam and of the signal particles, wherein the one opening is sized to allow a passage of charged particles backscattered from the sample at angles from 0&#xb0; to 20&#xb0; or above relative to the optical axis. Further, a method for imaging and/or inspecting a sample with a charged particle beam device is described.

Charged particle beam device and method for inspecting and/or imaging a sample

A charged particle beam device for imaging and/or inspecting a sample is described. The charged particle beam device includes a beam emitter for emitting a primary charged particle beam, the charged particle beam device adapted for guiding the primary charged particle beam along an optical axis to the sample for releasing signal particles; a retarding field device for retarding the primary charged particle beam before impinging on the sample, the retarding field device including an objective lens and a proxy electrode, wherein the proxy electrode includes an opening allowing a passage of the primary charged particle beam and of the signal particles; a first detector for off-axial backscattered particles between the proxy electrode and the objective lens; and a pre-amplifier for amplifying a signal of the first detector, wherein the pre-amplifier is at least one of (i) integrated with the first detector, (ii) arranged adjacent to the first detector inside a vacuum housing of the charged particle beam device, and (iii) fixedly mounted in a vacuum chamber of the charged particle beam device. Further, a method for imaging and/or inspecting a sample with a charged particle beam device is described.

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Poing, Germany

Birgit Schabinger