Zebra Technologies Corporation

Binyamin Stein

Edward D Barkan

Mark E Drzymala

Darran Michael Handshaw

David P Goren

The present disclosure provides new and innovative systems, methods, and apparatuses for detecting non-decode events in indicia scanning settings. In an example, a system comprises a depth imaging assembly, a 2D imaging assembly, and a processing device, wherein the processing device is configured to attempt to decode an indicium affixed to a first item that is passing through at least one of a field of view of the 2D imaging assembly or a field of view of the depth imaging assembly, determine a first characteristic associated with the first item based on depth data from the depth imaging array, and responsive to a failed attempt to decode the indicium, detect a second item that is passing through the field of view of the 2D imaging assembly and the field of view of the depth imaging assembly, determine a second characteristic associated with the second item based on depth data from the depth imaging assembly, determine if the first item is a same item as the second item based on comparing the first characteristic and the second characteristic, and responsive to determining that the first item and the second item are not the same item, transmit a message to an alert module that is indicative of a non-decode event.

Indicia tracking and decoding systems

A system is disclosed that includes an image sensor, a depth sensor, and at least one processor. The image sensor acquires images within a first field-of-view. The depth sensor includes a plurality of photosensitive cells that acquires distance information within a second field-of-view. The second field-of-view at least partially overlaps the first field-of-view. The at least one processor is programmed to transition from a first mode of operation to a second mode of operation in response to satisfaction of a specified criteria based on object information associated with the distance information for an object within the second field-of-view.

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Flushing, NY, United States of America

Binyamin Stein