Mloptic Corp.

Heraeus Precious Metal Technology (china) Co., Ltd.

China Electronics Technology Group Corporation No. 55 Research Institute

China Electronics Technology Group Corporation No. S5 Research Institute

Bin Zhang

Hongqi Tao

Wei Zhou

Jiang He

Teresa Zhang

Chen Chen

A method for recovering a precious metal from a precious metal-containing waste catalyst includes the following steps: i) at least partially dissolving a precious metal-containing waste catalyst in an alkaline aqueous solution; ii) performing filtering to obtain a precious metal-containing filtrate and a precious metal; iii) treating the filtrate with a reducing agent; and iv) separating the precious metal from the filtrate after treatment, wherein step iii) is performed under a pressure of 8-12 bar at a temperature of 190-210° C. for 2-4 h. The method provided in the present invention has a simple process and a high recovery rate. The filtrate obtained from separation comprises a precious metal of 1 ppm or less by weight.

Method for recovering precious metal from precious metal-containing waste catalyst

A comprehensive test platform for fluorescence microscope objective lenses, comprising a bottom plate (), wherein a horizontal adjustment device and a vertical fixing mechanism are provided on the bottom plate (); the horizontal adjustment device comprises a two-dimensional translation stage () and a two-dimensional tilting stage () stacked in sequence; a reticle () is provided on the two-dimensional tilting stage (); the vertical fixing mechanism comprises a back plate (), and the back plate () is fixedly connected onto the bottom plate (); an optical detection device and a guide sliding device () in the vertical direction are separately fixedly provided on the back plate (); and a sliding support () that can slide along the guide sliding device is provided on the guide sliding device (), and a measuring objective lens () is fixed on the sliding support ().

Comprehensive test platform for fluorescence microscope objective lenses

A method for detecting lens cleanliness of a lens in a flat-field optical path, the flat-field optical path includes a light source, the lens, a camera, the light source is a narrow-band multispectral uniform surface light source, the camera's light-sensitive surface is disposed perpendicular to an optical axis of the lens and in the light position of the lens, the method including disposing the camera such that the camera's light-sensitive surface is located a distance from the focal plane of the lens and measuring the bright-field image data and the dark-field image data; for each pixel, performing an out-of-focus differential flat field correction to yield a plurality of DiDj out-of-focus differentials; repeating the disposing and performing steps by altering the distance at least two more times; and displaying the out-of-focus differentials in the form of a plurality of images to show uniformity of each of the plurality of images.

Method of detecting lens cleanliness using out-of-focus differential flat field correction

Disclosed is an amplifier circuit with cross wiring of direct-current signals and microwave signals. The circuit includes a circuit network unit formed of a direct-current feeding circuit and a microwave power signal circuit. The direct-current feeding circuit comprises a high-electron-mobility transistor (HEMT) drain power-up bonding point, a corresponding line, a feeding end of a tail-level HEMT transistor core, a first Metal-Insulator-Metal (MIM) capacitor, a first micro-strip inductor, symmetrical branch micro-strips, a second MIM capacitors. The microwave power signal circuit comprises a signal end of the tail-level HEMT transistor core, two third MIM capacitors, other electrode of the second MIM capacitors, a ground micro-strip inductors, a second micro-strip inductors, a third micro-strip inductor, a fourth MIM capacitor.

Amplifier circuit with cross wiring of direct-current signals and microwave signals

Provided is an amplifier circuit with cross wiring of direct-current signals and microwave signals, which includes: two branch sub-circuits being mirrors with each other and a third capacitor The sub-circuit includes a direct-current feeding circuit and a microwave signal circuit. The direct-current feeding circuit further comprising: a transistor core drain power-up port (Vds) of a heterojunction field effect transistor (FET), a first micro-strip inductor, a first capacitor, a pair of third inductors, a pair of branched second inductors. The microwave signal circuit further comprising: A pair of third inductors, a pair of first capacitors, a pair of second capacitors, a pair of ground inductors, a pair of fourth inductors, a serially connected fifth inductor.

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Nanjing, China

Bin Zhang