Microvision, Inc.

Bin Xue

Margaret K Brown

Joshua Owen Miller

Randall Brian Sprague

P Selvan Viswanathan

Christopher A Wiklof

Mark O Freeman

Maarten Niesten

Jari Honkanen

Robert James Jackson

Douglas R Wade

John R Lewis

Hakan Urey

Wyatt Owen Davis

George Thomas Valliath

Jonathan A Morarity

Alga Lloyd Nothern, Iii

Gregory T Gibson

Thomas W Montague

Michael Lee Schaaf

Steve Holmes

A scanning display system includes two detectors for rangefinding. Round trip times-of-flight are measured for reflections of laser pulses received at the detectors. A proportional correction factor is determined based at least in part on the geometry of the scanning display system. The proportional correction factor is applied to the measured times-of-flight to create estimates of more accurate times-of-flight.

Scanned beam display with multiple detector rangefinding

Laser light pulses of at least two different wavelengths are reflected off a scanning mirror. A first time-of-flight distance measurement circuit receives reflected light pulses of a first wavelength and determines distances. A second time-of-flight distance measurement circuit receives reflected light pulses of a second wavelength and determines distances. The laser light pulses of different wavelengths may be interleaved in time to increase resolution. The laser light pulses of different wavelengths may also be used for detecting safety violations and/or power control.

Scanning 3D imaging device with power control using multiple wavelengths

Time division multiplexing of multiple wavelengths for high resolution scanning time of flight 3D imaging

A projection system emits light pulses in a field of view and measures properties of reflections. Properties may include time of flight and return amplitude. Foreground objects and background surfaces are distinguished, distances between foreground objects and background surfaces are determined based on reflections that are occluded by the foreground objects and other properties of the projection system.

Transmitter/receiver disparity for occlusion-based height estimation

Devices and methods are described herein for providing foveated image projection. In general, at least one source of laser light is used to generate a laser beam, and scanning mirror(s) that reflect the laser beam into a pattern of scan lines. The source of light is controlled to selectively generate projected image pixels during a first portion of the pattern of scan lines, and to selectively generate depth mapping pulses during a second portion of the pattern of scan lines. The projected image pixels generate a projected image, while the depth mapping pulses are reflected from the surface, received, and used to generate a 3-dimensional point clouds that describe the measured surface depth at each point. Thus, during each scan of the pattern both a projected image and a surface depth map can be generated, with the surface depth map used to modify some portion of the projected pixels.

Devices and methods for providing foveated scanning laser image projection with depth mapping

Devices and methods are described herein for combining image projection with surface scanning. In general, the devices and methods utilize at least one source of laser light to generate a laser beam, and scanning mirror(s) that reflect the laser beam into a pattern of scan lines. The source of light is controlled to selectively generate projected image pixels during a first portion of the pattern of scan lines, and to selectively generate depth mapping pulses during a second portion of the pattern of scan lines. The projected image pixels generate a projected image, while the depth mapping pulses are reflected from the surface, received, and used to generate a 3-dimensional point clouds that describe the measured surface depth at each point. Thus, during each scan of the pattern both a projected image and a surface depth map can be generated.

Devices and methods for providing depth mapping with scanning laser image projection

A scanning projector includes a programmable voltage source to provide a programmable voltage to a laser light source. A look-ahead circuit determines future voltage requirements by finding peaks in future pixel data. The programmable voltage may change for each frame of video, for each line of video, or multiple times within each line of video.

Laser diode voltage source controlled by video look-ahead

Laser light pulses are reflected off a scanning mirror. A time-of-flight distance measurement device receives reflected light pulses and determines distances. The light pulses have abrupt changes in amplitude. Reflected pulses are differentiated to reduce sensitivity to amplitude variations. Differentiated pulses may be compressed to keep the receiver from saturating. Distance measurements are combined with location information to produce a 3D image of a surface.

Scanning laser time of flight 3D imaging

An integrated photonics module may include a selective fold mirror configured to pass at least a portion of emitted light toward the MEMS scanner and reflect scanned light through to a field of view. The selective fold mirror may use beam polarization to select beam passing and reflection. The integrated photonics module may include a beam rotator such as a quarter-wave plate to convert the polarization of the emitted light to a different polarization adapted for passage through the fold mirror. The integrated photonics module may include one or more light detectors.

Integrated photonics module and devices using integrated photonics modules

An optical deflector includes multiple voltage-dependent refractive boundaries. Light passes through the refractive boundaries and accumulates a deflection angle. An electrode placed to apply a voltage to the boundaries may be non-uniform to modulate a wavefront as it passes. A scanning laser projector includes the optical deflector to modulate laser light.

Electro-optical deflection/modulation

Embodiments relate to a MEMS device including a scanner rotatable about at least one rotation axis, with the scanner having a characteristic resonant frequency. According to one embodiment, the MEMS device includes drive electronics operable to generate a drive signal that causes the scanner to oscillate at an operational frequency about the at least one rotation axis. The drive signal has a drive frequency selected to be about equal to the characteristic resonant frequency or a sub-harmonic frequency of the characteristic resonant frequency. According to another embodiment, the drive electronics are operable to generate a drive signal having a plurality of drive-signal pulses that moves the scanner at an operational frequency and sensing electronics are operable to sense a position of the scanner only when the drive-signal pulses of the drive signal are not being transmitted by the drive electronics. The MEMS device embodiments may be incorporated in scanned beam imagers, endoscopes, and displays.

MEMS devices and related scanned beam devices

An integrated photonics module includes at least one light source and a MEMS scanner coupled to and held in alignment by an optical frame configured for mounting to a host system. According to some embodiments, the integrated photonics module may include a plurality of light sources and a beam combiner coupled to the optical frame. According to some embodiments, the integrated photonics module includes a selective fold mirror configured to direct at least a portion of emitted light toward the MEMS scanner in a normal direction and pass scanned light through to a field of view. The selective fold mirror may use beam polarization to select beam passing and reflection. The integrated photonics module may include a beam rotator such as a quarter-wave plate to convert the polarization of the emitted light to a different polarization adapted for passage through the fold mirror. The integrated photonics module may include one or more light detectors.

Growing community of inventors

Mukilteo, WA, United States of America

Bin Xue