Samsung Electronics Co., Ltd.

Bilal Ahmad Janjua

Jungyu Lee

Vivek Venkata Kalluru

Venkataramana Gangasani

Ji-Hoon Lim

Jongryul Kim

Sungwhan Seo

Young-sun Min

Tae-hong Kwon

Sung-whan Seo

Sung Whan Seo

Ki-won Kim

Chiweon Yoon

Jeongdon Ihm

Makoto Hirano

Jihyun Park

June-Hong Park

Yong-jun Lee

Youngsun Min

Tae Hui Na

TaeHyun Kim

Jun-Gyu Lee

Chea-Ouk Lim

A method of generating clock signals includes: receiving a bandgap reference voltage from a bandgap reference circuit; generating a first current having a first curvature characteristic based on the bandgap reference voltage; generating a second current having a second curvature characteristic based on the bandgap reference voltage; generating a first complementary to absolute temperature (CTAT) current by adding the first current to the second current; receiving a temperature-variable voltage and a temperature-fixed voltage from a voltage generator; generating an offset current based on the temperature-variable voltage and the temperature-fixed voltage; generating a reference current by adding the first CTAT current to the offset current; and generating the clock signals by alternately discharging a first capacitor and a second capacitor based on the reference current, and charging the first capacitor and the second capacitor based on a power voltage.

Clock signal generator and operating method thereof

A memory device includes a plurality of memory cells, each including a switching device and an information storage device connected to the switching device and having a phase change material, the plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, a decoder circuit determining at least one of the plurality of memory cells to be a selected memory cell, and a program circuit configured to input a programming current to the selected memory cell to perform a programming operation and configured to detect a resistance of the selected memory cell to adjust a magnitude of the programming current.

Memory device and operating method thereof

A nonvolatile memory device includes a differential current driver that receives a first differential signal and a second differential signal, which are based on a temperature, and generates a first compensation current and a second compensation current corresponding to a difference value between the first and second differential signals. A current mirror circuit copies a first current, which is a sum of a reference current and the first compensation current, to generate a second current having a same value as a value of the first current and regulates the reference current depending on a difference value of the second current and the second compensation current. A trimming circuit generates a program current or a read current based on the regulated reference current.

Nonvolatile memory device including temperature compensation circuit

A memory device includes a charge pump connected to a power supply voltage and including a plurality of stages to output an output voltage, a stage counter configured to output a count value that incrementally increases to a number of the stages, and a regulator configured to compare the output voltage with a reference output voltage of the charge pump that is generated using the incrementally increasing count value obtained by the stage counter, and to output a pump operation signal at a time when the reference output voltage becomes greater than or equal to the output voltage, wherein the charge pump operates in response to the pump operation signal.

Memory device

A memory device including a memory cell area having a plurality of memory cells, and a peripheral circuit area including peripheral circuits configured to control the memory cells, the peripheral circuits connected to the memory cells by at least a portion of bit lines, word lines, and select lines may be provided. The peripheral circuits may include a reference voltage generator configured to output at least one reference voltage in response to control data of a control logic. The reference voltage generator may include a first resistor chain including first resistors connected in series between a first power node and a second power node, a second resistor chain including second resistors connected in series between the first power node and the second power node, and a plurality of decoders connected to the first resistor chain and the second resistor chain.

Voltage generator and memory device including the same

A resistive memory device includes a memory cell array of resistive memory cells connected to word and bit lines, each bay of the memory cell array including K tiles; a write/read circuit connected to the memory cell array through a row decoder and a column decoder, the write/read circuit being configured to perform a write operation in a target tile of the memory cell array, the write/read circuit comprising write drivers corresponding to the bays; a control voltage generator configured to generate first and second control voltages based on a reference current; and a control circuit configured to control the write/read circuit and the control voltage generator. A first write driver that corresponds to a first bay of the bays is configured to provide the target tile with a write current corresponding to a physical position of a selected memory cell of the target tile in the memory cell array.

Resistive memory devices and methods of operating resistive memory devices

A charge pump includes: a charging unit including a first n-type transistor connected between an input terminal configured to receive an input voltage and a first node, a second n-type transistor connected between the input terminal and a second node, a first gate control element configured to control the first n-type transistor based on a first clock signal and a second gate control element configured to control the second n-type transistor based on a second clock signal having a phase opposite to the first clock signal; a first pumping capacitor including one end connected to the first node and an other end configured to receive the first clock signal; a second pumping capacitor including one end connected to the second node and an other end configured to receive the second clock signal; and an output unit.

Charge pump and memory device including the same

A nonvolatile memory device includes a bank and a program current generator. The bank includes a memory cell array that includes phase change memory cells storing data based on a program current, and the transfer element transfers the program current to the memory cell array through current mirroring. The program current generator generates the program current based on a reference current.

Nonvolatile memory device including transfer element

An integrated circuit memory device includes an array of resistive memory cells and a programming circuit, which is electrically coupled by a plurality of word lines and plurality of bit lines to corresponding rows and columns of the resistive memory cells. The programming circuit includes a control circuit and word line driver that are collectively configured to generate word line program voltages having magnitudes that vary as a function of the row and/or column addresses of the resistive memory cells in the array, during operations to program the array with write data. According to the function, the magnitude of a word line program voltage associated with a first resistive memory cell having a first parasitic resistance is less than a magnitude of a word line program voltage associated with a second resistive memory cell having a second parasitic resistance, which is greater than the first parasitic resistance.

Resistive memory devices having address-dependent parasitic resistance compensation during programming

An electronic circuit includes a first switch circuit, a second switch circuit, a pumping circuit, and a main charge pump. The first switch circuit transfers a first driving voltage to a first node based on a first clock. The second switch circuit transfers a second driving voltage to a second node based on the first driving voltage of the first node. The pumping circuit outputs a pumping voltage having a level corresponding to a sum of a level of the second driving voltage and a first operation level of a second clock, based on the second driving voltage of the second node and the first operation level. The main charge pump converts an input voltage based on the pumping voltage.

Electronic circuit including charge pump for converting voltage

A memory device includes a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, each of the plurality of memory cells including a switching element and an information storage element connected to the switching element and containing a phase-change material, a decoder unit configured to determine a selected word line and a selected bit line connected to a selected memory cell to read data, among the plurality of memory cells, and a current compensation circuit configured to remove a leakage current from the selected word line, the leakage current corresponding to a sun of off-currents flowing in unselected bit lines, excluding the selected bit line, among the plurality of bit lines, from the selected word line.

Growing community of inventors

Suwon-si, South Korea

Bilal Ahmad Janjua